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Title:The Use of Hierarchy in Test Generation, Fault Simulation, and Testability Analysis Algorithms
Author(s):Rogers, William Arthur
Subject(s):Digital circuit design
Fault simulation
Automatic test pattern generation
Hierarchy in test generation
Fault simulation
Testability analysis algorithms
Issue Date:1988-01
Publisher:Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-88-2205, CSG-80
Genre:Report
Type:Text
Language:English
URI:http://hdl.handle.net/2142/88600
Sponsor:SRC
Hewlett-Packard
Semiconductor Research Corporation (including SRC member companies Hewlett-Packard and General Electric) / SRC 87-DP-109
Date Available in IDEALS:2015-12-10


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