Files in this item
Files | Description | Format |
---|---|---|
application/pdf ![]() ![]() | Full Text |
Description
Title: | Testing and Fault-Tolerance Aspect of High Density VLSI Memory |
Author(s): | Mazumder, Pinaki |
Subject(s): | Parallel testing
Fault tolerance On-line fault detection Testability VLSI memory |
Issue Date: | 1988-01 |
Publisher: | Coordinated Science Laboratory, University of Illinois at Urbana-Champaign |
Series/Report: | Coordinated Science Laboratory Report no. UILU-ENG-88-2206, CSG-81 |
Genre: | Report (Grant or Annual) |
Type: | Text |
Language: | English |
URI: | http://hdl.handle.net/2142/88601 |
Sponsor: | Semiconductor Research Corporation / 87-DP-109 |
Date Available in IDEALS: | 2015-12-10 2017-07-15 |