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Title:Testing and Fault-Tolerance Aspect of High Density VLSI Memory
Author(s):Mazumder, Pinaki
Subject(s):Parallel testing
Fault tolerance
On-line fault detection
Testability
VLSI memory
Issue Date:1988-01
Publisher:Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-88-2206, CSG-81
Genre:Report
Type:Text
Language:English
URI:http://hdl.handle.net/2142/88601
Sponsor:Semiconductor Research Corporation, 87-DP-109
Date Available in IDEALS:2015-12-10


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