Files in this item
| Files | Description | Format |
|---|---|---|
|
application/pdf  88-2206.pdf (5MB) | Full Text |
Description
| Title: | Testing and Fault-Tolerance Aspect of High Density VLSI Memory |
| Author(s): | Mazumder, Pinaki |
| Subject(s): | Parallel testing
Fault tolerance On-line fault detection Testability VLSI memory |
| Issue Date: | 1988-01 |
| Publisher: | Coordinated Science Laboratory, University of Illinois at Urbana-Champaign |
| Series/Report: | Coordinated Science Laboratory Report no. UILU-ENG-88-2206, CSG-81 |
| Genre: | Report (Grant or Annual) |
| Type: | Text |
| Language: | English |
| URI: | http://hdl.handle.net/2142/88601 |
| Sponsor: | Semiconductor Research Corporation / 87-DP-109 |
| Date Available in IDEALS: | 2015-12-10 2017-07-15 |