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Title:Probabilistic Simulation for Reliability Analysis of VLSI Circuits
Author(s):Najm, Farid Nasri
Subject(s):Probabilistic simulation
Reliability
Electromigration
Stochastic analysis
VLSI CMOS circuits
Pattern-independent analysis
Issue Date:1989-08
Publisher:Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-89-2221, DAC-14
Genre:Report
Type:Text
Language:English
URI:http://hdl.handle.net/2142/88615
Sponsor:Texas Instruments & U.S. Rome Air Development Center (RADC)
Date Available in IDEALS:2015-12-10


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