Files in this item
Files | Description | Format |
---|---|---|
application/pdf ![]() ![]() | Full text |
Description
Title: | Statistical Design of MOS VLSI Circuits with Designed Experiments |
Author(s): | Yu, Tat-Kwan Edgar |
Subject(s): | Statistical design
VLSI design Experimental design |
Issue Date: | 1990-03 |
Publisher: | Coordinated Science Laboratory, University of Illinois at Urbana-Champaign |
Series/Report: | Coordinated Science Laboratory Report no. UILU-ENG-90-2208, DAC-18 |
Genre: | Report (Grant or Annual) |
Type: | Text |
Language: | English |
URI: | http://hdl.handle.net/2142/88618 |
Sponsor: | Joint Services Electronics Program / N00014-84-C-0149 Semiconductor Research Corporation AT&T Bell Laboratories |
Date Available in IDEALS: | 2015-12-10 2017-07-15 |