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Title:Statistical Design of MOS VLSI Circuits with Designed Experiments
Author(s):Yu, Tat-Kwan Edgar
Subject(s):Statistical design
VLSI design
Experimental design
Issue Date:1990-03
Publisher:Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-90-2208, DAC-18
Genre:Report
Type:Text
Language:English
URI:http://hdl.handle.net/2142/88618
Sponsor:Joint Services Electronics Program / N00014-84-C-0149
Semiconductor Research Corporation / SRC 89-DP-Antic-Trick
AT&T Bell Laboratories
Date Available in IDEALS:2015-12-10


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