Files in this item
| Files | Description | Format |
|---|---|---|
|
application/pdf  B52-UILU-ENG-90-2208 -DAC-18_opt.pdf (2MB) | (no description provided) |
Description
| Title: | Statistical Design of MOS VLSI Circuits with Designed Experiments |
| Author(s): | Yu, Tat-Kwan Edgar |
| Subject(s): | Statistical design
VLSI design Experimental design |
| Issue Date: | 1990-03 |
| Publisher: | Coordinated Science Laboratory, University of Illinois at Urbana-Champaign |
| Series/Report: | Coordinated Science Laboratory Report no. UILU-ENG-90-2208, DAC-18 |
| Genre: | Report |
| Type: | Text |
| Language: | English |
| URI: | http://hdl.handle.net/2142/88618 |
| Sponsor: | Joint Services Electronics Program / N00014-84-C-0149 Semiconductor Research Corporation AT&T Bell Laboratories |
| Date Available in IDEALS: | 2015-12-10 2017-07-15 |