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Title:Computationally Efficient Methods for Accurate Timing and Reliability Simulation of Ultra-Large MOS Circuits
Author(s):Shih, Yung-Ho
Subject(s):Circuit simulation
Timing simulation
Reliability simulation
Waveform relaxation
Issue Date:1991-07
Publisher:Analog and Digital Circuits, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-91-2235, DAC-27
Genre:Report
Type:Text
Language:English
URI:http://hdl.handle.net/2142/88622
Sponsor:Joint Services Electronics Program / N00014-90-J-1270
Date Available in IDEALS:2015-12-10


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