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Title:Worst Case Voltage Drops in Power and Ground Buses of CMOS VLSI Circuits
Author(s):Kriplani, Harish
Subject(s):Voltage drop
CMOS circuits
VLSI circuit reliability
Power and ground buses
Maximum current
Issue Date:1993-11
Publisher:Analog and Digital Circuits, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-93-2248, DAC-43
Genre:Report
Type:Text
Language:English
URI:http://hdl.handle.net/2142/88626
Sponsor:Texas Instruments Inc., the Semiconductor Research Corporation (SRC), and USAF / 92-DP-109 and F30602-92-C-0059
Date Available in IDEALS:2015-12-10


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