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Title:A Simulation and Redesign System for Circuit Hot-Carrier Reliability
Author(s):Li, Ping-Chung
Subject(s):Hot-carrier
Reliability
Probabilistic simulation
VLSI circuits
Current estimation
Design for reliability
Issue Date:1994-05
Publisher:Analog and Digital Circuits, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-94-2215, DAC-45
Genre:Report
Type:Text
Language:English
URI:http://hdl.handle.net/2142/88627
Sponsor:Semiconductor Research Corporation (SRC) and USAF Rome Laboratory / 92-DP-109 and F30602-92-C-0059
Date Available in IDEALS:2015-12-10


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