Files in this item
| Files | Description | Format |
|---|---|---|
|
application/pdf  B52-UILU-ENG-94-2215 -DAC-45_opt.pdf (2MB) | (no description provided) |
Description
| Title: | A Simulation and Redesign System for Circuit Hot-Carrier Reliability |
| Author(s): | Li, Ping-Chung |
| Subject(s): | Hot-carrier
Reliability Probabilistic simulation VLSI circuits Current estimation Design for reliability |
| Issue Date: | 1994-05 |
| Publisher: | Analog and Digital Circuits, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign |
| Series/Report: | Coordinated Science Laboratory Report no. UILU-ENG-94-2215, DAC-45 |
| Genre: | Report |
| Type: | Text |
| Language: | English |
| URI: | http://hdl.handle.net/2142/88627 |
| Sponsor: | Semiconductor Research Corporation (SRC) and USAF Rome Laboratory / 92-DP-109 and F30602-92-C-0059 |
| Date Available in IDEALS: | 2015-12-10 2017-07-14 |