Files in this item
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Description
Title: | A Simulation and Redesign System for Circuit Hot-Carrier Reliability |
Author(s): | Li, Ping-Chung |
Subject(s): | Hot-carrier
Reliability Probabilistic simulation VLSI circuits Current estimation Design for reliability |
Issue Date: | 1994-05 |
Publisher: | Analog and Digital Circuits, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign |
Series/Report: | Coordinated Science Laboratory Report no. UILU-ENG-94-2215, DAC-45 |
Genre: | Report (Grant or Annual) |
Type: | Text |
Language: | English |
URI: | http://hdl.handle.net/2142/88627 |
Sponsor: | Semiconductor Research Corporation (SRC) and USAF Rome Laboratory / 92-DP-109 and F30602-92-C-0059 |
Date Available in IDEALS: | 2015-12-10 2017-07-14 |