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Title:Probabilistic Simulation for Reliability and Average Power Estimation
Author(s):Stamoulis, Georgios Ioannis
Subject(s):Reliability
Probabilistic simulation
Power estimation
Current estimation
CMOS circuits
Electromigration
Signal correlation
Issue Date:1994-05
Publisher:Analog and Digital Circuits, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-94-2219, DAC-49
Genre:Report
Type:Text
Language:English
URI:http://hdl.handle.net/2142/88629
Sponsor:Semiconductor Research Corporation (SRC) and U.S. Rome Air Development Center / 92-DP-109 and F30602-92-C-0059
Date Available in IDEALS:2015-12-10


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