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Title:Techniques for Automatic Test Knowledge Extraction from Compiled Circuits
Author(s):Thearling, Kurt Henry
Subject(s):Knowledge extraction
High-level synthesis
Testability
Circuit partitioning
Issue Date:1990-08
Publisher:Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-90-2234, CRHC-90-4
Genre:Report
Type:Text
Language:English
URI:http://hdl.handle.net/2142/88636
Sponsor:General Electric
Date Available in IDEALS:2015-12-10


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