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Title:Time-based Strategies for Semiconductor Manufacture and Test
Author(s):Levitt, Marc Elliot
Subject(s):Design styles
Architecture
Digital
Manufacturing science
Design-for-test
Testability
Faults
Scheduling
Issue Date:1990-08
Publisher:Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-90-2239, CRHC-90-9
Genre:Report
Type:Text
Language:English
URI:http://hdl.handle.net/2142/88639
Sponsor:Tektronix Corp.
Date Available in IDEALS:2015-12-10


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