Files in this item
| Files | Description | Format |
|---|---|---|
|
application/pdf  B55-UILU-ENG-91-2203-CRHC-91-1_opt.pdf (3MB) | (no description provided) |
Description
| Title: | Design, Diagnosis and Reconfiguration of Defect-Tolerant VLSI |
| Author(s): | Chang, Ming-Feng |
| Subject(s): | Defect-tolerant design
Memory diagnosis Reconfiguration Optimal testing K-out-of-n systems |
| Issue Date: | 1991-01 |
| Publisher: | Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign |
| Series/Report: | Coordinated Science Laboratory Report no. UILU-ENG-91-2203, CRHC-91-1 |
| Genre: | Report |
| Type: | Text |
| Language: | English |
| URI: | http://hdl.handle.net/2142/88644 |
| Sponsor: | Semiconductor Research Corporation (SRC) / 90-DP-109 Ministry of Education, Republic of China |
| Date Available in IDEALS: | 2015-12-10 2017-07-15 |