Files in this item
Files | Description | Format |
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application/pdf ![]() ![]() | Full Text |
Description
Title: | Design, Diagnosis and Reconfiguration of Defect-Tolerant VLSI |
Author(s): | Chang, Ming-Feng |
Subject(s): | Defect-tolerant design
Memory diagnosis Reconfiguration Optimal testing K-out-of-n systems |
Issue Date: | 1991-01 |
Publisher: | Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign |
Series/Report: | Coordinated Science Laboratory Report no. UILU-ENG-91-2203, CRHC-91-1 |
Genre: | Report (Grant or Annual) |
Type: | Text |
Language: | English |
URI: | http://hdl.handle.net/2142/88644 |
Sponsor: | Semiconductor Research Corporation (SRC) / 90-DP-109 Ministry of Education, Republic of China |
Date Available in IDEALS: | 2015-12-10 2017-07-15 |