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Title:Design, Diagnosis and Reconfiguration of Defect-Tolerant VLSI
Author(s):Chang, Ming-Feng
Subject(s):Defect-tolerant design
Memory diagnosis
Reconfiguration
Optimal testing
K-out-of-n systems
Issue Date:1991-01
Publisher:Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-91-2203, CRHC-91-1
Genre:Report
Type:Text
Language:English
URI:http://hdl.handle.net/2142/88644
Sponsor:Semiconductor Research Corporation (SRC) / 90-DP-109
Ministry of Education, Republic of China
Date Available in IDEALS:2015-12-10


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