Files in this item
Files | Description | Format |
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application/pdf ![]() ![]() | Full text |
Description
Title: | Techniques for Sequential Circuit Automatic Test Generation |
Author(s): | Niermann, Thomas Michael |
Subject(s): | Test pattern generation
Fault simulation Algorithms Reliability |
Issue Date: | 1991-03 |
Publisher: | Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign |
Series/Report: | Coordinated Science Laboratory Report no. UILU-ENG-91-2214, CRHC-91-8 |
Genre: | Report (Grant or Annual) |
Type: | Text |
Language: | English |
URI: | http://hdl.handle.net/2142/88648 |
Sponsor: | Semiconductor Research Corp. / 90-DP-109 |
Date Available in IDEALS: | 2015-12-10 2017-07-15 |