Files in this item
| Files | Description | Format |
|---|---|---|
|
application/pdf  91-2214.pdf (4MB) | Full text |
Description
| Title: | Techniques for Sequential Circuit Automatic Test Generation |
| Author(s): | Niermann, Thomas Michael |
| Subject(s): | Test pattern generation
Fault simulation Algorithms Reliability |
| Issue Date: | 1991-03 |
| Publisher: | Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign |
| Series/Report: | Coordinated Science Laboratory Report no. UILU-ENG-91-2214, CRHC-91-8 |
| Genre: | Report |
| Type: | Text |
| Language: | English |
| URI: | http://hdl.handle.net/2142/88648 |
| Sponsor: | Semiconductor Research Corp. / 90-DP-109 |
| Date Available in IDEALS: | 2015-12-10 2017-07-15 |