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Title:Automatic Test Generation for Bit-serial VLSI Digital Signal Processors
Author(s):Roy, Rabindra Kumar
Subject(s):Signal processing
VLSI
Hierarchical testing
Test generation
Bit-serial architecture
Issue Date:1992-02
Publisher:Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-92-2208, CRHC-92-05
Genre:Report
Type:Text
Language:English
URI:http://hdl.handle.net/2142/88654
Sponsor:Semiconductor Research Corporation
General Electric / expired gift
Date Available in IDEALS:2015-12-10


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