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Title:High current pulse characterization of semiconductor devices
Author(s):Thomson, Nicholas A
Advisor(s):Rosenbaum, Elyse
Department / Program:Electrical & Computer Engineering
Discipline:Electrical & Computer Engineering
Degree Granting Institution:University of Illinois at Urbana-Champaign
Degree:M.S.
Genre:Thesis
Subject(s):Electrostatic Discharge (ESD)
Transmission Line-Pulse (TLP)
Abstract:A new ESD testing system, the exponential-edge transmission line pulse system (EETLP), is presented. EETLP generates 100 ns square pulses with a variable, exponentially decaying falling edge. When applied to an ESD protection device, the pulse shape allows for capture of both the transient and quasi-steady-state responses, in the context of a single measurement. EETLP provides unprecedented insight into the turn-off dynamics of snapback-type devices. Device measurement data are presented to demonstrate the capabilities of EETLP.
Issue Date:2015-12-09
Type:Thesis
URI:http://hdl.handle.net/2142/89078
Rights Information:Copyright 2015 Nicholas Thomson
Date Available in IDEALS:2016-03-02
Date Deposited:2015-12


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