Files in this item
Files | Description | Format |
---|---|---|
application/pdf ![]() | (no description provided) |
Description
Title: | High current pulse characterization of semiconductor devices |
Author(s): | Thomson, Nicholas A |
Advisor(s): | Rosenbaum, Elyse |
Department / Program: | Electrical & Computer Engineering |
Discipline: | Electrical & Computer Engineering |
Degree Granting Institution: | University of Illinois at Urbana-Champaign |
Degree: | M.S. |
Genre: | Thesis |
Subject(s): | Electrostatic Discharge (ESD)
Transmission Line-Pulse (TLP) |
Abstract: | A new ESD testing system, the exponential-edge transmission line pulse system (EETLP), is presented. EETLP generates 100 ns square pulses with a variable, exponentially decaying falling edge. When applied to an ESD protection device, the pulse shape allows for capture of both the transient and quasi-steady-state responses, in the context of a single measurement. EETLP provides unprecedented insight into the turn-off dynamics of snapback-type devices. Device measurement data are presented to demonstrate the capabilities of EETLP. |
Issue Date: | 2015-12-09 |
Type: | Text |
URI: | http://hdl.handle.net/2142/89078 |
Rights Information: | Copyright 2015 Nicholas Thomson |
Date Available in IDEALS: | 2016-03-02 |
Date Deposited: | 2015-12 |
This item appears in the following Collection(s)
-
Dissertations and Theses - Electrical and Computer Engineering
Dissertations and Theses in Electrical and Computer Engineering -
Graduate Dissertations and Theses at Illinois
Graduate Theses and Dissertations at Illinois