Files in this item
| Files | Description | Format |
|---|---|---|
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application/pdf  THOMSON-THESIS-2015.pdf (2MB) | (no description provided) |
Description
| Title: | High current pulse characterization of semiconductor devices |
| Author(s): | Thomson, Nicholas A |
| Advisor(s): | Rosenbaum, Elyse |
| Department / Program: | Electrical & Computer Engineering |
| Discipline: | Electrical & Computer Engineering |
| Degree Granting Institution: | University of Illinois at Urbana-Champaign |
| Degree: | M.S. |
| Genre: | Thesis |
| Subject(s): | Electrostatic Discharge (ESD)
Transmission Line-Pulse (TLP) |
| Abstract: | A new ESD testing system, the exponential-edge transmission line pulse system (EETLP), is presented. EETLP generates 100 ns square pulses with a variable, exponentially decaying falling edge. When applied to an ESD protection device, the pulse shape allows for capture of both the transient and quasi-steady-state responses, in the context of a single measurement. EETLP provides unprecedented insight into the turn-off dynamics of snapback-type devices. Device measurement data are presented to demonstrate the capabilities of EETLP. |
| Issue Date: | 2015-12-09 |
| Type: | Thesis |
| URI: | http://hdl.handle.net/2142/89078 |
| Rights Information: | Copyright 2015 Nicholas Thomson |
| Date Available in IDEALS: | 2016-03-02 |
| Date Deposited: | 2015-12 |
This item appears in the following Collection(s)
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Dissertations and Theses - Electrical and Computer Engineering
Dissertations and Theses in Electrical and Computer Engineering -
Graduate Dissertations and Theses at Illinois
Graduate Theses and Dissertations at Illinois