Browse Illinois Research and Scholarship by Subject "onchip parameter variations"

  • Akram, Shoaib; Cromar, Scott A.; Lucas, Gregory; Papakonstantinou, Alexandros; Chen, Deming (IEEE, 2008-04-08)
    Billions of devices on a chip is around the corner and the trend of deep submicron (DSM) technology scaling will continue for at least another decade. Meanwhile, designers also face severe on-chip parameter variations, ...


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