Browse Illinois Research and Scholarship (Open Collection) by Subject "scanning tunneling microscopy"

  • Field-Directed Sputter Sharpening for Tailored Probe Materials and Atomic-Scale Lithography 
    Schmucker, Scott W.; Kumar, Navneet; Abelson, John R.; Daly, Scott R.; Girolami, Gregory S.; Bischof, Maia R.; Jaeger, David L.; Reidy, Rick F.; Gorman, Brian P.; Alexander, Justin; Ballard, Josh B.; Randall, John N.; Lyding, Joseph W. (Nature Publishing Group, 2012-07-03)
    Fabrication of ultra-sharp probes is of interest for many applications, including scanned probe microscopy and electron-stimulated patterning of surfaces. These techniques require reproducible ultra-sharp metallic tips, ...

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