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Title:The c33 elastic constant of MoS2 as a function of pressure and the deposition of multilayer thin films by sputtering
Author(s):Li, May-Ling Marie
Advisor(s):Cahill, David G
Department / Program:Materials Science & Engineerng
Discipline:Materials Science & Engr
Degree Granting Institution:University of Illinois at Urbana-Champaign
diamond anvil cell
elastic constants
brillouin scattering
Abstract:The c33 elastic constant of exfoliated MoS2 flakes was measured up to 11 GPa using a diamond anvil cell and picosecond interferometry. The resulting elastic constants were similar those predicted by hybrid density functional theory calculations by Peelaers and Van de Walle, but lower than those calculated from lattice constant measurements by Fan. However, due to the failure of the Lorentz-Lorenz relationship between index of refraction n and density, the change in n was not compensated for. This means that the actual c33constants are lower than those that have been reported here. A two source sputtering chamber for deposition of [Co,Pt] multilayer transducers for use in time-resolved magneto-optical Kerr effect (TR-MOKE) experiments is also discussed, along with the preliminary film and transducer characterization. Four-point probe measurements of the thin films indicated high resistivities corresponding to roughness or small grain size. A multilayer transducer was tested on a SiO2 reference wafer and had a dθ_K/dT of the same order of magnitude as similar [Co,Pt] transducers.
Issue Date:2016-04-28
Rights Information:Copyright 2016 May-Ling Li
Date Available in IDEALS:2016-07-07
Date Deposited:2016-05

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