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Title:Transmission-line pulse testing software design
Author(s):Pace, Molly
Contributor(s):Rosenbaum, Elyse
Degree:B.S. (bachelor's)
Genre:Thesis
Subject(s):transmission-line test
very fast transmission-line test
Tester
GPIB
ESD
C#
Abstract:Transmission-line pulse testing (TLP) and very fast transmission-line pulse testing (VF-TLP) are used to study the high current behaviors of integrated circuits and semiconductor devices, to characterize device response to electrostatic-discharge (ESD) events, and to provide the quasi-static IV curve for the devices. However, commercial TLP and VF-TLP testers are extremely expensive and have limited configurability. Smaller ESD labs need alternatives to expensive equipment. Through this work, I have automated TLP and VF-TLP testing through existing instruments in the lab, making these tests available to research labs on a smaller budget. An oscilloscope, a pulse generator, a parameter analyzer, and a probing station have been integrated using C# programming language to automate both tests. All devices communicate via GPIB and are controlled through a graphical user interface (GUI). This document explains how to set up the GUI and interact with the equipment to create a very reliable tester.
Issue Date:2016-05
Genre:Dissertation / Thesis
Type:Text
Language:English
URI:http://hdl.handle.net/2142/91557
Date Available in IDEALS:2016-08-30


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