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Title:Design of a clock and data recovery circuit in 65 nm technology
Author(s):Ren, Yi
Advisor(s):Schutt-Aine, Jose E
Department / Program:Electrical & Computer Eng
Discipline:Electrical & Computer Engr
Degree Granting Institution:University of Illinois at Urbana-Champaign
Degree:M.S.
Genre:Thesis
Subject(s):Clock and data recovery (CDR)
Abstract:As semiconductor fabrication technology develops, the demand for higher transmission data rates constantly increases; thus there is an urgent need for a power-efficient, robust and broad bandwidth chip-to-chip communication method. A lot of work has been done to address this issue as researchers strive for more integrated inter-IC communication technology with CMOS. A high-speed serial link (HSSL) can help meet this goal. The clock and data recovery circuit (CDR) is a critical component of the HSSL. CDR is built on the receiver end of the link after proper equalization. Its purpose is to extract clock signal which is not transmitted from the driver end and to use the extracted clock signal to sample the incoming data stream with optimal timing. In this thesis, the working mechanism of the CDR is described. A CDR consists of a phase detector, a charge pump, a loop filter and a voltage-controlled oscillator. This thesis includes an overview of all the building blocks of a PLL-based CDR, derivation of the mathematical formulations of the negative feedback loop, and a report on closed loop behavioral modeling of the entire CDR and implemented CDR building blocks at transistor level with TSMC 65 nm technology PDK with a 6.4 Gbps data rate. Also, this thesis provides a detailed noise analysis of the CDR. Lastly, some future work and possible design improvements are proposed.
Issue Date:2016-07-19
Type:Thesis
URI:http://hdl.handle.net/2142/92964
Rights Information:Copyright 2016 Yi Ren
Date Available in IDEALS:2016-11-10
Date Deposited:2016-08


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