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Title:Verify CMOS inverter circuit model using thin variable technique
Author(s):Meng, Yu
Contributor(s):Mitra, Sayan
Subject(s):CMOS inverter circuit model
input verification of nonlinear and hybrid circuit models
metastability of circuits
Abstract:There has been progress in verification of nonlinear and hybrid systems in the recent years using algorithms that combine simulation data with model-based sensitivity analysis. These approaches only handle closed models, that is, models without inputs. The naïve introduction of models of input signals breaks these approaches, as typical inputs (fast sigmoids, discontinuous functions) for analog and mixed analog-signal circuits make the system highly sensitive and the number of needed simulations grow rapidly. In this thesis, we present a new technique for verifying nonlinear and hybrid circuit models with inputs. A key result in the thesis shows that once an input signal is fixed, the sensitivity analysis of the model can be performed much more precisely. Based on this observation, we extend a discrepancy-based verification algorithm and apply it to a suite of nonlinear and hybrid models of CMOS digital circuits under different input signals. The models are low-dimensional but involve highly nonlinear ODEs, with nearly hundreds of logarithmic and exponential terms, and therefore, have challenged existing verification approaches and tools. Our implementation of the new algorithm is able to verify these models; some of our experiments analyze the metastability of bistable circuits, which involve very sensitive ODEs. Our results not only demonstrate the feasibility of our approach, but also provided interesting insights like the close connection between metastability recovery time and sensitivity.
Issue Date:2017-05
Genre:Other
Type:Text
Language:English
URI:http://hdl.handle.net/2142/97871
Date Available in IDEALS:2017-08-22


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