2026-09-21T01:34:12Z https://www.ideals.illinois.edu/oai-pmh

oai:www.ideals.illinois.edu:2142/102509 2023-07-11 col_2142_5131 col_2142_8888 com_2142_5130 com_2142_8887 com_2142_234

Rosenbaum, Elyse Vora, Sandeep Gautam 2019-02-06T19:36:42Z 2019-02-06T19:36:42Z 2018-12-11 2018-12 Hardware and application-level manifestations of ESD soft failures were characterized for three single-board computers. ESD events were generated following the system-level ESD standard (IEC 61000-4-2), matching real-world testing and events. Soft failures resulting from ESD were seen on all products tested. Failures associated with the peripheral ICs occur independently of the application being run; the application-dependent failures are attributed to noise at the CPU. Submission original under an indefinite embargo labeled 'Open Access'. The submission was exported from vireo on 2019-02-05 without embargo terms The student, Sandeep Vora, accepted the attached license on 2018-12-10 at 17:23. The student, Sandeep Vora, submitted this Thesis for approval on 2018-12-10 at 17:34. This Thesis was approved for publication on 2018-12-11 at 10:14. DSpace SAF Submission Ingestion Package generated from Vireo submission #13276 on 2019-02-05 at 11:16:02 Made available in DSpace on 2019-02-06T19:36:42Z (GMT). No. of bitstreams: 3 VORA-THESIS-2018.pdf: 1247932 bytes, checksum: 49a4a4b0ef86c08477716f7a8bf5164f (MD5) Vora_MS-Final.docx: 1069402 bytes, checksum: f6dfc7f9235fbbcea6da287262db74e2 (MD5) LICENSE.txt: 4209 bytes, checksum: b4d9116397a2a9cbbccc55b383aa6cf7 (MD5) Previous issue date: 2018-12-11 application/pdf http://hdl.handle.net/2142/102509 en Copyright 2018 Sandeep Vora ESD Soft Failures System-Level ESD IEC 61000-4-2 Soft Failure Investigating soft failures induced by system-level ESD text text Electrical & Computer Eng Electrical & Computer Engr University of Illinois at Urbana-Champaign Thesis M.S.