2026-09-21T05:03:45Z https://www.ideals.illinois.edu/oai-pmh

oai:www.ideals.illinois.edu:2142/105514 2023-07-11 col_2142_5131 col_2142_8888 com_2142_5130 com_2142_8887 com_2142_234

Krein, Philip T. Banerjee, Abhishek 2019-11-07T19:32:31Z 2019-11-07T19:32:31Z 2007 Open Restriction set for Item 112658 on 2019-11-07T19:24:03Z with date null by astein@illinois.edu. Submitted by Ayla Kenfield (astein@illinois.edu) on 2019-11-07T19:32:31Z No. of bitstreams: 1 behavioralanalys00bane.pdf: 6073015 bytes, checksum: ba1405cbee642d867fab5a821f5e0276 (MD5) Made available in DSpace on 2019-11-07T19:32:31Z (GMT). No. of bitstreams: 1 behavioralanalys00bane.pdf: 6073015 bytes, checksum: ba1405cbee642d867fab5a821f5e0276 (MD5) Previous issue date: 2007 Open https://n2t.net/ark:/13960/t8fg1h01x http://hdl.handle.net/2142/105514 en Copyright 2007 Abhishek Banerjee Electrical and computer engineering Behavioral analysis of insulated gate bipolar transistors during hard and soft turn-off Dissertation / Thesis text Electrical & Computer Engineering Electrical and Computer Engineering University of Illinois at Urbana-Champaign Thesis M.S. (master's) Master of Science in Electrical and Computer Engineering