2026-09-22T16:40:56Z https://www.ideals.illinois.edu/oai-pmh

oai:www.ideals.illinois.edu:2142/110870 2023-07-11 col_2142_5131 col_2142_8888 com_2142_5130 com_2142_8887 com_2142_234

Banerjee, Arijit Jin, Qichen 2021-09-17T04:06:56Z 2021-09-17T04:06:56Z 2023-09-17T04:07:01Z 2021-04-29 2021-05 A fault detection and prediction method for insulated-gate bipolar transistors (IGBTs) has been improved over the past decades to reduce system downtime. In situ lifetime estimation of IGBT modules has been challenging due to a number of requirements: the necessity to operate at high voltage in the switching environment and the measurement precision of the gate-threshold voltage or collector-to-emitter voltage. This thesis presents a wear-fatigue estimation framework that consists of collector-to-emitter measurement, power loss calculation, and thermal lifetime prediction model. The measurement circuit enables the estimation of power loss across a variety of IGBT modules with minimum impact on system reliability. Submission published under a 24 month embargo labeled 'Closed Access', the embargo will last until 2023-05-01 The student, Qichen Jin, accepted the attached license on 2021-04-29 at 10:53. The student, Qichen Jin, submitted this Thesis for approval on 2021-04-29 at 10:58. This Thesis was approved for publication on 2021-04-29 at 15:19. DSpace SAF Submission Ingestion Package generated from Vireo submission #16596 on 2021-09-16 at 20:14:39 Made available in DSpace on 2021-09-17T04:06:56Z (GMT). No. of bitstreams: 2 JIN-THESIS-2021.pdf: 6209551 bytes, checksum: 1618ec4b0a2337862ce247be7fea5741 (MD5) LICENSE.txt: 4207 bytes, checksum: 826538afd1e41c59525d27dafa1f185a (MD5) Previous issue date: 2021-04-29 Embargo set by: Seth Robbins for item 118716 Lift date: 2023-09-17T04:07:01Z Reason: Author requested closed access (OA after 2yrs) in Vireo ETD system Author requested closed access (OA after 2yrs) in Vireo ETD system Limited application/pdf http://hdl.handle.net/2142/110870 en Copyright 2021 Qichen Jin IGBT real-time monitoring lifetime estimation In situ power-loss estimation of IGBT modules text Thesis Electrical & Computer Eng Electrical & Computer Engr University of Illinois at Urbana-Champaign Thesis M.S.