2026-09-22T05:07:25Z https://www.ideals.illinois.edu/oai-pmh

oai:www.ideals.illinois.edu:2142/14660 2023-07-10 col_2142_5131 col_2142_14787 com_2142_5130 com_2142_9630 com_2142_234

King, William P. King, William P. Felts, Jonathan 2010-01-06T16:20:43Z 2010-01-06T16:20:43Z 2010-01-06T16:20:43Z We describe an atomic force microscope cantilever design for which the second flexural mode frequency can be tailored relative to the first mode frequency, for operation in contact with a substrate. A freely-resonating paddle internal to the cantilever reduces the stiffness of the second flexural mode relative to the first while nearly maintaining the mass of the original cantilever. This strategy allows the ratio of the first two resonant modes f2/f1 to be controlled over the range 1.6 – 4.5. The ability to vary f2/f1 could improve a variety of dynamic contact-mode measurements. Item withdrawn by Mark Zulauf (zulauf@illinois.edu) on 2009-11-10T21:26:31Z Item was in collections: University of Illinois Theses & Dissertations (ID: 1) No. of bitstreams: 2 Felts_Jonathan.pdf: 512484 bytes, checksum: 1211c5d9cd37fc5c650297e0ae8f89fd (MD5) Felts_Jonathan.docx: 1666749 bytes, checksum: 631d9fedd85f0b6d462518e66db88376 (MD5) Made available in DSpace on 2010-01-06T16:20:43Z (GMT). No. of bitstreams: 4 license.txt: 4062 bytes, checksum: 0e8090e1738a8e0e32796da6d2f232cb (MD5) Felts_Jonathan.docx: 1666378 bytes, checksum: 77e31e972f200231ac00465f3d82ca96 (MD5) Felts_Jonathan.pdf: 512484 bytes, checksum: 1211c5d9cd37fc5c650297e0ae8f89fd (MD5) 1_Felts_Jonathan.pdf: 512475 bytes, checksum: de52d80918c3573403e4dac9746df062 (MD5) http://hdl.handle.net/2142/14660 en Copyright 2009 Jonathan R. Felts Atomic Force Microscope micro cantilever harmonic frequency mode shapes Atomic force microscope cantilever with reduced second harmonic frequency during tip-surface contact 2009-12 Mechanical Sci & Engineering 1917 Mechanical Engineering 0133 University of Illinois at Urbana-Champaign Thesis M.S. PHD:Mechanical Enginerng -UIUC 10KS0133PHD