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oai:www.ideals.illinois.edu:2142/14721 2023-07-10 col_2142_5131 col_2142_8888 com_2142_5130 com_2142_8887 com_2142_234

Shanbhag, Naresh R. Shanbhag, Naresh R. Kim, Eric P. 2010-01-06T16:41:53Z 2010-01-06T16:41:53Z 2012-01-07T11:00:08Z 2010-01-06T16:41:53Z Achieving energy-efficiency in nanoscale CMOS process technologies is made challenging due to the presence of process, temperature and voltage variations. In this thesis, we present soft N-modular redundancy (soft NMR) that exploits statistics of errors due to these nanoscale artifacts in order to design robust and energy-efficient systems. In contrast to conventional NMR, soft NMR employs estimation and detection techniques in the voter. Analysis of soft NMR, NMR and ANT is given to facilitate future design of systems employing such robust techniques. We also compare NMR and soft NMR in the design of an energy-e cient and robust discrete cosine transform (DCT) image coder. Simulations in a commercial 45 nm, 1:2 V, CMOS process show that soft triple-MR (TMR) provides 10 improvement in robustness and 13% power savings over TMR at the same peak signal-to-noise ratio (PSNR) of 20 dB. In addition, soft dual-MR (DMR) provides a 2x improvement in robustness and a 35% power savings over TMR at the same PSNR of 20 dB. An FPGA implementation of the 2-D DCT showed that hardware emulation results match the RTL simulations. Item withdrawn by Mark Zulauf (zulauf@illinois.edu) on 2009-11-05T20:33:58Z Item was in collections: University of Illinois Theses & Dissertations (ID: 1) No. of bitstreams: 1 Kim_Eric.pdf: 1452106 bytes, checksum: c7fb3a2fd8e0be8bf48af429b01c2bc1 (MD5) Made available in DSpace on 2010-01-06T16:41:53Z (GMT). No. of bitstreams: 2 license.txt: 4056 bytes, checksum: 81e2ef572153d42588941f009985c2cb (MD5) Kim_Eric.pdf: 1452106 bytes, checksum: c7fb3a2fd8e0be8bf48af429b01c2bc1 (MD5) Item marked as restricted to the 'UIUC Users [automated]' Group (id=2) by William Ingram (wingram2@illinois.edu) on 2010-01-06T16:42:21Z Item is restricted until 2012-01-06T16:42:19Z Item reinstated by Sarah Shreeves (sshreeve@illinois.edu) on 2012-01-07T11:00:08Z Item was in collections: University of Illinois Dissertations and Theses (ID: 204) Dissertations and Theses - Electrical and Computer Engineering (ID: 446) No. of bitstreams: 3 Kim_Eric.pdf.txt: 81509 bytes, checksum: fb9bc45748343ae3aebcaa9535794645 (MD5) license.txt: 4056 bytes, checksum: 81e2ef572153d42588941f009985c2cb (MD5) Kim_Eric.pdf: 1452106 bytes, checksum: c7fb3a2fd8e0be8bf48af429b01c2bc1 (MD5) Item released from any restrictions by Sarah Shreeves (sshreeve@illinois.edu) on 2012-01-07T11:00:08Z http://hdl.handle.net/2142/14721 en Copyright 2009 Eric P. Kim fault tolerance low power algorithmic technique signal processing N-modular redundancy Soft N-modular redundancy: exploiting statistics for robust computation 2009-12 Electrical & Computer Eng 1933 Electrical & Computer Engr 1200 University of Illinois at Urbana-Champaign Thesis M.S. PHD:Electr & Computer Eng-UIUC 10KS1200PHD