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oai:www.ideals.illinois.edu:2142/18281 2023-07-10 col_2142_5131 col_2142_8888 com_2142_5130 com_2142_8887 com_2142_234

Shanbhag, Naresh R. Lee, Yu-Hung 2011-01-14T22:44:30Z 2011-01-14T22:44:30Z 2011-01-14T22:44:30Z We make a case for developing statistical error models of nanoscale circuits, employing these for designing robust systems, and engineering error-statistics to enhance the performance of various robust design techniques. A simple additive error model is presented for arithmetic computations. The proposed error model is shown to be a strong function of the architecture, and a weak function of the input statistics, thus enabling a one-time off-line characterization similar to delay and power characterization done presently. In addition, we propose architectural diversity and scheduling diversity to engineer the occurrence of independent errors as required by robust system design techniques such as soft N-modular redundancy (NMR). Finally, we employ error statistics to develop soft dual-MR (DMR) and triple-MR (TMR) techniques for the adder operation and the filter design. All quantitative results are demonstrated in a commercial 45 nm CMOS process. Item withdrawn by Mark Zulauf (zulauf@illinois.edu) on 2010-12-09T18:14:26Z Item was in collections: University of Illinois Theses & Dissertations (ID: 1) No. of bitstreams: 1 Lee_Yu-Hung.pdf: 7820755 bytes, checksum: 51b21feac3093910aa61900db7c545d7 (MD5) Made available in DSpace on 2011-01-14T22:44:30Z (GMT). No. of bitstreams: 2 Lee_Yu-Hung.pdf: 7820755 bytes, checksum: 51b21feac3093910aa61900db7c545d7 (MD5) license.txt: 4055 bytes, checksum: ec355f64b87096260ed8c7b76ebdc37c (MD5) http://hdl.handle.net/2142/18281 en Copyright 2010 Yu-Hung Lee robust system design error statistics diversity technique error model Characterization and Engineering of Error Statistics for Reliable Computation 2010-12 Electrical & Computer Eng 1933 Electrical & Computer Engr 1200 University of Illinois at Urbana-Champaign Thesis M.S. MS:Electr & Computer Eng-UIUC 10KS1200MS