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        <identifier>oai:www.ideals.illinois.edu:2142/18297</identifier>
        <datestamp>2023-07-10</datestamp>
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        <thesis xmlns="http://www.ndltd.org/standards/metadata/etdms/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:dc="http://purl.org/dc/elements/1.1/" xsi:schemaLocation="http://www.ndltd.org/standards/metadata/etdms/1.1/ http://www.ndltd.org/standards/metadata/etdms/1.1/etdms11.xsd http://purl.org/dc/elements/1.1/ http://www.ndltd.org/standards/metadata/etdms/1.1/etdmsdc.xsd">
          <dc:contributor>Feng, Milton</dc:contributor>
          <dc:creator>Bambery, Rohan</dc:creator>
          <dc:date>2011-01-14T22:45:18Z</dc:date>
          <dc:date>2011-01-14T22:45:18Z</dc:date>
          <dc:date>2011-01-14T22:45:18Z</dc:date>
          <dc:description>Efforts to push the performance of transistors for millimeter-wave and microwave
applications have borne fruit through device size scaling and the use of novel material 
systems. III-V semiconductors and their alloys hold a distinct advantage over silicon 
because they have much higher electron mobility which is a prerequisite for high frequency 
operation. InGaAs/InP pseudomorphic heterojunction bipolar transistors (HBTs) have 
demonstrated fT of 765 GHz at room temperature and InP based high electron 
mobility transistors (HEMTs) have demonstrated fMax of 1.2 THz. The 6.1 A lattice 
family of InAs, GaSb, AlSb covers a wide variety of band gaps and is an attractive future 
material system for high speed device development. Extremely high electron 
mobilities ~ 30,000 cm^2 V^-1s^-1 have been achieved in modulation 
doped InAs-AlSb structures. The work described in this thesis involves material 
characterization and process development for HEMT fabrication on this material system.</dc:description>
          <dc:description>Item withdrawn by Rebecca Bryant (rabryant@illinois.edu) on 2010-10-08T14:38:50Z
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University of Illinois Theses &amp; Dissertations (ID: 1)
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          <dc:identifier>http://hdl.handle.net/2142/18297</dc:identifier>
          <dc:language>en</dc:language>
          <dc:rights>Copyright 2010 Rohan K. Bambery</dc:rights>
          <dc:subject>High Electron Mobility Transistor (HEMT)</dc:subject>
          <dc:subject>Aluminium Antimonide (AlSb)</dc:subject>
          <dc:subject>Indium Arsenide (InAs)</dc:subject>
          <dc:title>Material characterization and process development for indium-arsenide / indium-gallium-antimonide channel, high electron mobility transistors for low power, high speed applications</dc:title>
          <dc:date>2010-12</dc:date>
          <degree>
            <department>Electrical &amp; Computer Eng</department>
            <departmentCode>1933</departmentCode>
            <discipline>Electrical &amp; Computer Engr</discipline>
            <disciplineCode>1200</disciplineCode>
            <grantor>University of Illinois at Urbana-Champaign</grantor>
            <level>Thesis</level>
            <name>M.S.</name>
            <program>MS:Electr &amp; Computer Eng-UIUC</program>
            <programCode>10KS1200MS</programCode>
          </degree>
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