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oai:www.ideals.illinois.edu:2142/18570 2023-07-10 col_2142_5131 col_2142_8888 com_2142_5130 com_2142_8887 com_2142_234

Boppart, Stephen A. Shin, Sunghwan 2011-01-21T22:46:54Z 2011-01-21T22:46:54Z 2013-01-22T11:00:26Z 2011-01-21T22:46:54Z 2010-12 This thesis research investigates the effects of optical source noise in optical coherence tomography (OCT). While shot noise, thermal noise and relative intensity noise (RIN) (excess photon noise) constitute optical noise, RIN is the least understood and often the most significant factor limiting the sensitivity of an optical system. The existing and prevalent theory being used for estimating RIN for various light sources in OCT is questionable, and cannot be applied uniformly for different types of sources. The origin of noise in various sources varies significantly, owing to the different physical nature of photon generation. In this thesis, RIN of several OCT light sources are characterized and compared. Light sources include a super-luminescent diode (SLD), an erbium-doped fiber amplifier (EDFA), multiplexed SLDs, and a continuous wave (cw) laser. A method for the reduction of RIN by amplifying the SLD light output by using a gain-saturated semiconductor optical amplifier (SOA) is reported. Also, measurements using a time-domain OCT (TD-OCT) system are performed to verify the effects of optical source noise reduction on OCT data. Simulations comparing OCT and ISAM images assuming an identical optical source noise are also performed and explained. Item withdrawn by Mark Zulauf (zulauf@illinois.edu) on 2010-12-09T22:33:24Z Item was in collections: University of Illinois Theses & Dissertations (ID: 1) No. of bitstreams: 2 Shin_MS_Thesis_v13_with_Ack.docx: 1129447 bytes, checksum: 59e3e3cb6f5945510701c91eec979f42 (MD5) Shin_Sunghwan.pdf: 1280730 bytes, checksum: ff5b5bc6b475ab6f71c20af975a803b0 (MD5) Made available in DSpace on 2011-01-21T22:46:54Z (GMT). No. of bitstreams: 3 Shin_Sunghwan.pdf: 1280730 bytes, checksum: ff5b5bc6b475ab6f71c20af975a803b0 (MD5) license.txt: 4061 bytes, checksum: 225a02fd809930b4b939fde7894a4b9c (MD5) Shin_MS_Thesis_v13_with_Ack.docx: 1129447 bytes, checksum: 59e3e3cb6f5945510701c91eec979f42 (MD5) Item marked as restricted to the 'UIUC Users [automated]' Group (id=2) by William Ingram (wingram2@illinois.edu) on 2011-01-21T22:48:22Z Item is restricted until 2013-01-21T22:47:37Z Item reinstated by Sarah Shreeves (sshreeve@illinois.edu) on 2013-01-22T11:00:26Z Item was in collections: University of Illinois Dissertations and Theses (ID: 204) Dissertations and Theses - Electrical and Computer Engineering (ID: 446) No. of bitstreams: 4 Shin_Sunghwan.pdf: 1280730 bytes, checksum: ff5b5bc6b475ab6f71c20af975a803b0 (MD5) license.txt: 4061 bytes, checksum: 225a02fd809930b4b939fde7894a4b9c (MD5) Shin_MS_Thesis_v13_with_Ack.docx: 1129447 bytes, checksum: 59e3e3cb6f5945510701c91eec979f42 (MD5) Shin_Sunghwan.pdf.txt: 69343 bytes, checksum: 65fccb322105a8b9056c6dd498ae7c25 (MD5) Item released from any restrictions by Sarah Shreeves (sshreeve@illinois.edu) on 2013-01-22T11:00:26Z http://hdl.handle.net/2142/18570 en Copyright 2010 Sunghwan Shin optical coherence tomography relative intensity noise Characterization and comparison of optical source relative intensity noise and effects in optical coherence tomography Electrical & Computer Eng 1933 Electrical & Computer Engr 1200 University of Illinois at Urbana-Champaign Thesis M.S. MS:Electr & Computer Eng-UIUC 10KS1200MS