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Chiu, Yun Chiu, Yun Shanbhag, Naresh R. Rosenbaum, Elyse Singer, Andrew C. Liu, Wenbo 2011-01-21T22:52:11Z 2011-01-21T22:52:11Z 2013-01-22T11:00:16Z 2011-01-21T22:52:11Z 2010-12 This dissertation presents the design of three high-performance successive-approximation-register (SAR) analog-to-digital converters (ADCs) using distinct digital background calibration techniques under the framework of a generalized code-domain linear equalizer. These digital calibration techniques effectively and efficiently remove the static mismatch errors in the analog-to-digital (A/D) conversion. They enable aggressive scaling of the capacitive digital-to-analog converter (DAC), which also serves as sampling capacitor, to the kT/C limit. As a result, outstanding conversion linearity, high signal-to-noise ratio (SNR), high conversion speed, robustness, superb energy efficiency, and minimal chip-area are accomplished simultaneously. The first design is a 12-bit 22.5/45-MS/s SAR ADC in 0.13-μm CMOS process. It employs a perturbation-based calibration based on the superposition property of linear systems to digitally correct the capacitor mismatch error in the weighted DAC. With 3.0-mW power dissipation at a 1.2-V power supply and a 22.5-MS/s sample rate, it achieves a 71.1-dB signal-to-noise-plus-distortion ratio (SNDR), and a 94.6-dB spurious free dynamic range (SFDR). At Nyquist frequency, the conversion figure of merit (FoM) is 50.8 fJ/conversion step, the best FoM up to date (2010) for 12-bit ADCs. The SAR ADC core occupies 0.06 mm2, while the estimated area the calibration circuits is 0.03 mm2. The second proposed digital calibration technique is a bit-wise-correlation-based digital calibration. It utilizes the statistical independence of an injected pseudo-random signal and the input signal to correct the DAC mismatch in SAR ADCs. This idea is experimentally verified in a 12-bit 37-MS/s SAR ADC fabricated in 65-nm CMOS implemented by Pingli Huang. This prototype chip achieves a 70.23-dB peak SNDR and an 81.02-dB peak SFDR, while occupying 0.12-mm2 silicon area and dissipating 9.14 mW from a 1.2-V supply with the synthesized digital calibration circuits included. The third work is an 8-bit, 600-MS/s, 10-way time-interleaved SAR ADC array fabricated in 0.13-μm CMOS process. This work employs an adaptive digital equalization approach to calibrate both intra-channel nonlinearities and inter-channel mismatch errors. The prototype chip achieves 47.4-dB SNDR, 63.6-dB SFDR, less than 0.30-LSB differential nonlinearity (DNL), and less than 0.23-LSB integral nonlinearity (INL). The ADC array occupies an active area of 1.35 mm2 and dissipates 30.3 mW, including synthesized digital calibration circuits and an on-chip dual-loop delay-locked loop (DLL) for clock generation and synchronization. Item withdrawn by Mark Zulauf (zulauf@illinois.edu) on 2010-11-30T20:41:29Z Item was in collections: University of Illinois Theses & Dissertations (ID: 1) No. of bitstreams: 2 Liu_Wenbo.doc: 31347712 bytes, checksum: f20a1854de58c2dc7aad4c4b48da5c1c (MD5) Liu_Wenbo.pdf: 8643612 bytes, checksum: f5f48c639529d0eaab79e1854dbceff0 (MD5) Made available in DSpace on 2011-01-21T22:52:11Z (GMT). No. of bitstreams: 3 Liu_Wenbo.pdf: 8643551 bytes, checksum: 7a8c1b846835a0230436dc440d674986 (MD5) Liu_Wenbo.doc: 31347712 bytes, checksum: f20a1854de58c2dc7aad4c4b48da5c1c (MD5) license.txt: 4056 bytes, checksum: b0d0e7abac09a6248094f5991ccf1130 (MD5) Item marked as restricted to the 'Administrator' Group (id=1) by William Ingram (wingram2@illinois.edu) on 2011-01-21T22:53:56Z Item is restricted until 2013-01-21T22:53:34Z Item reinstated by Sarah Shreeves (sshreeve@illinois.edu) on 2013-01-22T11:00:16Z Item was in collections: University of Illinois Dissertations and Theses (ID: 204) Dissertations and Theses - Electrical and Computer Engineering (ID: 446) No. of bitstreams: 4 Liu_Wenbo.pdf.txt: 164901 bytes, checksum: a02f3820a050b1d6004e944d8c659443 (MD5) Liu_Wenbo.pdf: 8643551 bytes, checksum: 7a8c1b846835a0230436dc440d674986 (MD5) Liu_Wenbo.doc: 31347712 bytes, checksum: f20a1854de58c2dc7aad4c4b48da5c1c (MD5) license.txt: 4056 bytes, checksum: b0d0e7abac09a6248094f5991ccf1130 (MD5) Item released from any restrictions by Sarah Shreeves (sshreeve@illinois.edu) on 2013-01-22T11:00:16Z http://hdl.handle.net/2142/18623 en Copyright 2010 Wenbo Liu successive-approximation-register (SAR) analog-to-digital converters (ADC) redundancy sub-radix-2 Nonlinearity digital calibration linear equalizer generalized linear equalizer perturbation bit-wise correlation channel mismatch time-interleaved analog-to-digital converters (ADC) Low-power high-performance SAR ADC design with digital calibration techniques Electrical & Computer Eng 1933 Electrical & Computer Engr 1200 University of Illinois at Urbana-Champaign Dissertation Ph.D. PHD:Electr & Computer Eng-UIUC 10KS1200PHD