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        <identifier>oai:www.ideals.illinois.edu:2142/19667</identifier>
        <datestamp>2023-07-10</datestamp>
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        <thesis xmlns="http://www.ndltd.org/standards/metadata/etdms/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:dc="http://purl.org/dc/elements/1.1/" xsi:schemaLocation="http://www.ndltd.org/standards/metadata/etdms/1.1/ http://www.ndltd.org/standards/metadata/etdms/1.1/etdms11.xsd http://purl.org/dc/elements/1.1/ http://www.ndltd.org/standards/metadata/etdms/1.1/etdmsdc.xsd">
          <dc:contributor>Hess, Karl</dc:contributor>
          <dc:creator>Yoder, Paul Douglas</dc:creator>
          <dc:date>2011-05-07T12:14:41Z</dc:date>
          <dc:date>2011-05-07T12:14:41Z</dc:date>
          <dc:date>10000-01-01</dc:date>
          <dc:date>1994</dc:date>
          <dc:description>A new multiscale method is presented for modeling charge transport across a semi-conductor heterointerface. It has the advantage of increase predictive power due to its treatment of the detailed mixing between Bloch and Tamm electronic states in the interface region; this is of critical importance when a transmission or reflection is accompanied by large changes in perpendicular wavevector, and in the presence of multiple transmission and reflection channels. The electron-phonon interaction is then examined in bulk silicon within the local density functional formalism. Intravalley and intervalley deformation potentials are calculated for a variety of transitions, and the model is compared with available data from both experimental and alternative calculation methods. The formalism developed in this thesis for the calculation of electron-phonon interaction strength is then applied to the calculation of matrix elements for an exhaustive set of transitions throughout the entire Brillouin zone and over a wide range of energies, taking into account the details of each phonon mode. These matrix elements are then incorporated into a unique Monte Carlo charge transport simulator with which transport statistics are calculated. Finally, a new method is presented for the calculation of spectral functions in crystalline solids.</dc:description>
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  Previous issue date: 1994</dc:description>
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Item is restricted indefinitely.</dc:description>
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Original Data
Group with Access UIUC Users [automated]
Release Date: none
Reason: ETDs are only available to UIUC Users without author permission</dc:description>
          <dc:description>ETDs are only available to UIUC Users without author permission</dc:description>
          <dc:description>U of I Only</dc:description>
          <dc:identifier>AAI9416455</dc:identifier>
          <dc:identifier>(UMI)AAI9416455</dc:identifier>
          <dc:identifier>http://hdl.handle.net/2142/19667</dc:identifier>
          <dc:language>eng</dc:language>
          <dc:rights>Copyright 1994 Yoder, Paul Douglas</dc:rights>
          <dc:subject>Engineering, Electronics and Electrical</dc:subject>
          <dc:title>First principles Monte Carlo simulation of charge transport in semiconductors</dc:title>
          <dc:type>text</dc:type>
          <degree>
            <department>Electrical and Computer Engineering</department>
            <discipline>Electrical Engineering</discipline>
            <grantor>University of Illinois at Urbana-Champaign</grantor>
            <level>Dissertation</level>
            <name>Ph.D.</name>
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