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Abraham, Jacob A. Brahme, Dhananjay S. 2011-05-07T13:56:10Z 2011-05-07T13:56:10Z 10000-01-01 1990 This thesis addresses the problem of testing complex VLSI circuits. Traditional test generation used either low level gate descriptions or low level heuristics such as controllability and observability. In this thesis we have introduced a knowledge based approach to testing, which is based on (i) a hierarchical structural description of the circuit, (ii) a high level behavioral description, and (iii) high-level reasoning. The high-level behavior is specified by a (a) forward function, (b) reverse mfunction, (c) propapage-error functions and (d) the test mfunction for the device. It is shown that this additional knowledge results in significant speedup of the test generation process. We have also developed a new procedure for testing VLSI circuits which have both data and control components. We use the knowledge of data and control paths to propagate and backtrace differently for data and control paths. This results in a substantial speedup of the test generation process for complex VLSI circuits. Finally we have introduced a concept of Class B sequential circuits and developed a technique for testing these circuits, which during the propagate phase of testing a fault marks other tests which are covered by the current test. This drastically reduces the number of tests generated and the time taken for testing Class B sequential circuits. Made available in DSpace on 2011-05-07T13:56:10Z (GMT). No. of bitstreams: 2 license.txt: 4922 bytes, checksum: 910b249b4beec47e7ab768910c8f966f (MD5) 9021656.pdf: 2169675 bytes, checksum: 91ebb1132de941acd4a1509e0b34ca16 (MD5) Previous issue date: 1990 Item marked as restricted to the 'UIUC Users [automated]' Group (id=2) by Howard Ding (hding2@illinois.edu) on 2011-05-07T15:00:58Z Item is restricted indefinitely. Restriction data tranferred 2014-07-01T11:28:54-05:00 Original Data Group with Access UIUC Users [automated] Release Date: none Reason: ETDs are only available to UIUC Users without author permission ETDs are only available to UIUC Users without author permission U of I Only AAI9021656 (UMI)AAI9021656 http://hdl.handle.net/2142/22927 eng Copyright 1990 Brahme, Dhananjay S. Engineering, Electronics and Electrical Artificial Intelligence Computer Science Knowledge-based testing of VLSI circuits text Electrical and Computer Engineering Electrical and Computer Engineering University of Illinois at Urbana-Champaign Dissertation Ph.D.