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oai:www.ideals.illinois.edu:2142/23457 2023-07-10 col_2142_5131 col_2142_8888 com_2142_5130 com_2142_8887 com_2142_234

Patel, Janak H. Cha, Hungse 2011-05-07T14:14:53Z 2011-05-07T14:14:53Z 10000-01-01 1994 Mixed analog and digital mode simulators have been available for accurate alpha-particle-induced transient fault simulation. However, they are not fast enough to simulate a large number of transient faults on a relatively large circuit in a reasonable amount of time. This thesis describes a fast transient fault simulator which can evaluate the effects of alpha-particle hits or single event upsets (SEUs) in CMOS standard cell based synchronous sequential VLSI circuits. The speed comes from approximating the initial analog effects with gate level models, as well as using an improved transient fault simulation algorithm in a hierarchy of simulators. The simulator is shown to be between four to five orders of magnitude faster than a very accurate circuit simulator at the expense of some accuracy and some limitations on the types of circuits simulatable. Using this simulator, benchmark circuits have been tested for their behavior under alpha-particle injections. The experiments show that the one bit flip model is not a good model for injecting faults in highly fault tolerant systems. The experiments also show that at the pin level, no simple model exists which can mimic the behavior of the circuit hit with alpha particles. The simulator's usefulness is also shown in the development of a transient pulse tolerant D flip-flop (DFF). The tool is used to demonstrate the tradeoff between transient pulse tolerance and latch performance. Made available in DSpace on 2011-05-07T14:14:53Z (GMT). No. of bitstreams: 2 license.txt: 4922 bytes, checksum: 910b249b4beec47e7ab768910c8f966f (MD5) 9512321.pdf: 3252970 bytes, checksum: ba5f9b6ae40a827b31548dc93de511b7 (MD5) Previous issue date: 1994 Item marked as restricted to the 'UIUC Users [automated]' Group (id=2) by Howard Ding (hding2@illinois.edu) on 2011-05-07T15:04:36Z Item is restricted indefinitely. Restriction data tranferred 2014-07-01T11:30:53-05:00 Original Data Group with Access UIUC Users [automated] Release Date: none Reason: ETDs are only available to UIUC Users without author permission ETDs are only available to UIUC Users without author permission U of I Only AAI9512321 (UMI)AAI9512321 http://hdl.handle.net/2142/23457 eng Copyright 1994 Cha, Hungse Engineering, Electronics and Electrical A gate-level simulator for alpha-particle-induced transient faults text Engineering, Electronics and Electrical Engineering, Electronics and Electrical University of Illinois at Urbana-Champaign Dissertation Ph.D.