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oai:www.ideals.illinois.edu:2142/23592 2023-07-10 col_2142_5131 col_2142_8888 com_2142_5130 com_2142_8887 com_2142_234

Song, Bang-Sup Lee, Seung-Hoon 2011-05-07T14:19:54Z 2011-05-07T14:19:54Z 10000-01-01 1991 Flash-type analog-to-digital converters (ADCs) have been extensively used for high-speed applications such as high-performance TVs, image recognition, radar, and medical instrumentation. However, the linearity of these state-of-the-art flash-type ADCs has been limited to 10 bits by ratio mismatch of passive components. Although techniques such as laser-trimming, self-calibration and error-averaging have been developed to achieve high matching accuracy of components, they are not readily applied to flash-type ADCs. This thesis proposes a direct, digital code-error, calibration technique to improve the linearity of two-step flash ADCs. When implemented in MOS technologies, this technique eliminates other errors resulting from MOS switch feedthrough, op amp offsets, and interstage gain errors. Nonlinearities of ADCs are statistically simulated considering component mismatch and other nonideal factors. A test chip has been verified by ADICE and ISPLICE3 and implemented using a 2 $\mu$m N-well CMOS technology from Analog Devices, Inc. Experimental results of the prototype show that the proposed calibration technique reduces total harmonic distortion from $-$64 dB to $-$77 dB and improves signal-to-noise ratio from 61 dB to 67 dB after calibration. Made available in DSpace on 2011-05-07T14:19:54Z (GMT). No. of bitstreams: 2 license.txt: 4922 bytes, checksum: 910b249b4beec47e7ab768910c8f966f (MD5) 9136650.pdf: 4488144 bytes, checksum: 20824cfc1b614b723edcd42697c3df90 (MD5) Previous issue date: 1991 Item marked as restricted to the 'UIUC Users [automated]' Group (id=2) by Howard Ding (hding2@illinois.edu) on 2011-05-07T15:05:31Z Item is restricted indefinitely. Restriction data tranferred 2014-07-01T11:31:23-05:00 Original Data Group with Access UIUC Users [automated] Release Date: none Reason: ETDs are only available to UIUC Users without author permission ETDs are only available to UIUC Users without author permission U of I Only AAI9136650 (UMI)AAI9136650 http://hdl.handle.net/2142/23592 eng Copyright 1991 Lee, Seung-Hoon Engineering, Electronics and Electrical Code-error calibration techniques for two-step flash analog-to-digital converters text Engineering, Electronics and Electrical Engineering, Electronics and Electrical University of Illinois at Urbana-Champaign Dissertation Ph.D.