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oai:www.ideals.illinois.edu:2142/23617 2023-07-10 col_2142_5131 col_2142_8888 com_2142_5130 com_2142_8887 com_2142_234

The impact of electron traps on the transfer performance of acoustic charge transport devices text Hoskins, Michael J. Janes, David Bruce 2011-05-07T14:20:47Z 2011-05-07T14:20:47Z 10000-01-01 1989 Presented in this thesis are experimental and theoretical investigations of the transfer loss in GaAs Acoustic Charge Transport (ACT) devices caused by electron traps. An experimental method employing characterization of trap parameters and measurements of frequency response and pulse degradation in ACT devices is developed for evaluating the effects of trapping loss on device performance. Experimental results are presented for measurements on standard devices and devices in which traps have been intentionally introduced using proton bombardment. A simple theory is developed for modeling trapping loss for general input signals and trap distributions. The theory is used to predict the response of the device for the special cases of periodic pulse and small signal sinusoidal input signals. Good qualitative agreement is found between the theoretical predictions and the experimental results. An increase in trap emission rates is observed in the presence of the surface acoustic wave (SAW) used to transport charge in the ACT device. The emission rate enhancement caused by the SAW is investigated through deep level transient spectroscopy (DLTS) studies, measurements on ACT devices, and a theoretical analysis of the effects of the electric fields, acoustic strains, and channel heating associated with the SAW. Made available in DSpace on 2011-05-07T14:20:47Z (GMT). No. of bitstreams: 2 license.txt: 4922 bytes, checksum: 910b249b4beec47e7ab768910c8f966f (MD5) 8924852.pdf: 4139236 bytes, checksum: e595e43781e009337b52e6a308c01a09 (MD5) Previous issue date: 1989 Item marked as restricted to the 'UIUC Users [automated]' Group (id=2) by Howard Ding (hding2@illinois.edu) on 2011-05-07T15:05:41Z Item is restricted indefinitely. Restriction data tranferred 2014-07-01T11:31:30-05:00 Original Data Group with Access UIUC Users [automated] Release Date: none Reason: ETDs are only available to UIUC Users without author permission ETDs are only available to UIUC Users without author permission U of I Only AAI8924852 (UMI)AAI8924852 http://hdl.handle.net/2142/23617 eng Copyright 1989 Janes, David Bruce Engineering, Electronics and Electrical Engineering, Electronics and Electrical Engineering, Electronics and Electrical University of Illinois at Urbana-Champaign Dissertation Ph.D.