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Brown, Frederick C. Hulbert, Steven Lloyd 2011-06-07T17:25:19Z 2011-06-07T17:25:19Z 10000-01-01 1984 High resolution soft x-ray absorption near edge structure (XANES) spectra have been obtained for CU20 and for SiGe1-x semiconductor alloys, xas a function of composition x, using the methods of partial electron yield and thin film absorption. The shapes of the near edge features provide a unique fingerprint of the local crystal structure (symmetries, coordinations, bond lengths, etc.) in the bulk. A strong asymmetric peak at threshold in Cu20 is probably best described as a Frenkel core exciton corresponding to an allowed Cu 2p + alg molecular orbital transition of the rare linear (0-Cu-0)3-molecular unit characteristic of Cu20. A dramatic change in the observed soft x-ray absorption near edge structure (XANES) for x = 0.15 in SixGe1-x is consistent with the x-dependence predicted for this alloy system by Newman and Dow. The design, operating characteristics, and advantages of the University of Illinois beam line at the 1 GeV electron storage ring Aladdin, including the new extended range grasshopper (ERG) grazing incidence grating monochromator for use in the VUV and soft x-ray spectral ranges, are presented. Submitted by Carolyn Mead (cmead2@illinois.edu) on 2011-06-07T17:25:19Z No. of bitstreams: 1 1984_hulbert.pdf: 4608401 bytes, checksum: 45065b7c6a7ce4953df7659294c6e820 (MD5) Made available in DSpace on 2011-06-07T17:25:19Z (GMT). No. of bitstreams: 1 1984_hulbert.pdf: 4608401 bytes, checksum: 45065b7c6a7ce4953df7659294c6e820 (MD5) Previous issue date: 1984 Restriction data tranferred 2014-07-01T11:14:34-05:00 Original Data Group with Access UIUC Users [automated] Release Date: none Reason: Thesis Item marked as restricted to the 'UIUC Users [automated]' Group (id=2) by Carolyn Mead (cmead2@illinois.edu) on 2011-06-07T17:25:20Z Item is restricted indefinitely. Thesis U of I Only 824806 http://hdl.handle.net/2142/25341 en 1984 Steven Lloyd Hulbert high resolution soft x-ray absroption near edge structure (XANES) silicon-germanium semiconductor alloys cuprous oxide crystal structure Soft x-ray near edge spectroscopy of cuprous oxide and silicon-germanium alloys Dissertation / Thesis text Physics Physics University of Illinois at Urbana-Champaign Dissertation Ph.D.