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Ginsberg, D.M. Escher, John Stuart 2011-07-26T20:13:51Z 2011-07-26T20:13:51Z 10000-01-01 1970 Critical state measurements of single and binary thin film systems have been measured as a function of transport current density, magnetic field, temperature, and degree of annealing. Results are interpreted in terms of the present understanding of the mixed state in thin films. Studies of vorteK guiding, the Hall angle in the mixed state, and ac versus dc measurement methods are reported. An unusual fluctuation effect in the resistive superconducting transition in many of our films is reported. The failure of the Aslamazov- Larkin theory to fit our resistive transition data is noted and compared with other recent experimental data on thin films. Submitted by Carolyn Mead (cmead2@illinois.edu) on 2011-07-26T20:13:51Z No. of bitstreams: 1 1970_escher.pdf: 2754368 bytes, checksum: 22bc0ef25ef387ac70eb2fb596bf09db (MD5) Made available in DSpace on 2011-07-26T20:13:51Z (GMT). No. of bitstreams: 1 1970_escher.pdf: 2754368 bytes, checksum: 22bc0ef25ef387ac70eb2fb596bf09db (MD5) Previous issue date: 1970 Item marked as restricted to the 'UIUC Users [automated]' Group (id=2) by Carolyn Mead (cmead2@illinois.edu) on 2011-07-26T20:13:51Z Item is restricted indefinitely. Restriction data tranferred 2014-07-01T11:32:56-05:00 Original Data Group with Access UIUC Users [automated] Release Date: none Reason: Thesis Thesis U of I Only 6065097 http://hdl.handle.net/2142/25849 en 1970 John Stuart Escher magnetic flux flow fluctuation effects thin film superconductors critical state measurements Magnetic flux flow and fluctuation effects in thim film superconductors Dissertation / Thesis text University of Illinois at Urbana-Champaign Dissertation Ph.D. Physics Physics