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        <identifier>oai:www.ideals.illinois.edu:2142/29680</identifier>
        <datestamp>2023-07-10</datestamp>
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        <thesis xmlns="http://www.ndltd.org/standards/metadata/etdms/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:dc="http://purl.org/dc/elements/1.1/" xsi:schemaLocation="http://www.ndltd.org/standards/metadata/etdms/1.1/ http://www.ndltd.org/standards/metadata/etdms/1.1/etdms11.xsd http://purl.org/dc/elements/1.1/ http://www.ndltd.org/standards/metadata/etdms/1.1/etdmsdc.xsd">
          <dc:contributor>Sanders, William H.</dc:contributor>
          <dc:contributor>Agha, Gul A.</dc:contributor>
          <dc:contributor>Levinson, Stephen E.</dc:contributor>
          <dc:contributor>Viswanathan, Mahesh</dc:contributor>
          <dc:contributor>Zhou, Pin</dc:contributor>
          <dc:creator>Rozier, Eric</dc:creator>
          <dc:date>2012-02-06T20:10:40Z</dc:date>
          <dc:date>2012-02-06T20:10:40Z</dc:date>
          <dc:date>2011-12</dc:date>
          <dc:date>2012-02-06T20:10:40Z</dc:date>
          <dc:date>2011-12</dc:date>
          <dc:description>Modern storage systems continue to increase in scale and complexity
as they attempt to meet the increasing storage needs
of our society.  Additionally, increased requirements to comply with
government regulation and consumer expectations have increased the    
need to make data more available and reliable for longer periods of time. 
The design of modern and next-generation storage systems is a difficult task
that requires high storage capacity and efficiency while also
maintaining the data integrity.
The rapid advancement of storage system technologies brings with it a
level of uncertainty as to the fitness of new designs and methods for meeting
the complex requirements.  New technologies, like deduplication, promise     
improved storage efficiency, but their impact on reliability measures is unclear
due to the complex relationships inherent to the systems that employ these 
technologies. 
Additionally, as systems scale up, they become subject to faults 
and errors that previous-generation systems may never have encountered due
to the rare nature of these faults.  
Because of  the stiffness
of the represented systems, and the complex relationships involved,
it can be difficult to analyze these environments correctly and efficiently.
In this dissertation, we propose a method to analyze storage system reliability 
by using
component-based models coupled with realistic fault models.  We solve these 
complex systems
by identifying fault, fault propagation, and mitigation events; by identifying 
dependence relationships
between state variables, events, and rewards; and by decomposing our model at 
various points
during model solution to improve the efficiency of our solution
while maintaining the correctness of our reward measures.
In particular, we discuss building scalable component-based models 
of large-scale systems that employ modern reliability methods, such as RAID,
and state-of-the-art storage efficiency methods such as deduplication.  We
present detailed fault models for these systems, including a novel model for 
undetected disk errors.  To enable efficient solution of these models 
we propose 
a method to analyze the dependence relationships that underlie storage systems 
and propose a way to solve these models by identifying and exploiting 
these relationships when solving for reliability measures.  
We apply 
our methods to real-world systems, detail the consequences for the reliability
 of deduplication,
and suggest and evaluate methods to improve reliability while 
still maintaining improved storage efficiency.</dc:description>
          <dc:description>Item withdrawn by Mark Zulauf (zulauf@illinois.edu) on 2011-11-30T21:28:03Z
Item was in collections:
University of Illinois Theses &amp; Dissertations (ID: 1)
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          <dc:identifier>http://hdl.handle.net/2142/29680</dc:identifier>
          <dc:language>en</dc:language>
          <dc:rights>Copyright 2011 Eric William Davis Rozier</dc:rights>
          <dc:subject>storage systems</dc:subject>
          <dc:subject>modeling</dc:subject>
          <dc:subject>simulation</dc:subject>
          <dc:subject>rare-events</dc:subject>
          <dc:subject>fault-tolerance</dc:subject>
          <dc:title>Understanding the fault-tolerance properties of large-scale storage systems</dc:title>
          <dc:type>Dissertation / Thesis</dc:type>
          <dc:type>text</dc:type>
          <degree>
            <department>Computer Science</department>
            <departmentCode>1434</departmentCode>
            <discipline>Computer Science</discipline>
            <disciplineCode>0112</disciplineCode>
            <grantor>University of Illinois at Urbana-Champaign</grantor>
            <level>Dissertation</level>
            <name>Ph.D.</name>
            <program>PHD:Computer Science -UIUC</program>
            <programCode>10KS0112PHD</programCode>
          </degree>
        </thesis>
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