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oai:www.ideals.illinois.edu:2142/31018 2023-07-10 col_2142_5131 col_2142_8888 com_2142_5130 com_2142_8887 com_2142_234

2012-05 Feng, Milton Iverson, Eric 2012-05-22T00:21:52Z 2012-05-22T00:21:52Z 2012-05-22T00:21:52Z 2012-05 Dynamic range characterization of double-heterojunction bipolar transistors is examined. The measurement procedures are detailed, along with a novel procedure for calibrating load-pull measurements using all on-chip calibration standards. The use of all on-chip calibration standards can reduce potential calibration errors caused by cable movement. Also detailed are the suspected physical origins of nonlinearity in Type-I DHBTs, which are not present in Type-I/II DHBTs. Both simulated and measured data is shown to support the hypothesis that heterojunction current blocking and base push-out are major sources of nonlinearity in Type-I DHBTs. It is also shown that Type-I/II DHBTs do not exhibit such problems due to their simpler layer structure. Item withdrawn by Rebecca Bryant (rabryant@illinois.edu) on 2012-04-17T17:46:43Z Item was in collections: University of Illinois Theses & Dissertations (ID: 1) No. of bitstreams: 2 Full_Thesis_v3_Final.docx: 3113554 bytes, checksum: 3f18e2d8764c317a54d628a363ecbe3a (MD5) Iverson_Eric.pdf: 1701855 bytes, checksum: f8a7ab8d0c90491f3831c758febb4075 (MD5) Made available in DSpace on 2012-05-22T00:21:52Z (GMT). No. of bitstreams: 3 Iverson_Eric.pdf: 1701855 bytes, checksum: f8a7ab8d0c90491f3831c758febb4075 (MD5) Full_Thesis_v3_Final.docx: 3113554 bytes, checksum: 3f18e2d8764c317a54d628a363ecbe3a (MD5) license.txt: 4062 bytes, checksum: e9ad90e26c67f9728db88e4a132d6c53 (MD5) http://hdl.handle.net/2142/31018 en Copyright 2012 Eric Iverson Indium Phospide (InP) double-heterojunction bipolar transistors (DHBT) Type-I Type-II Type-I/II Hot Electron Noise Figure Linearity third-order intercept point (IP3) Gain Compression Dynamic Range Dynamic range characterization of indium-phosphide double-heterojunction bipolar transistors for ultralinear sub-millimeter wave applications text Electrical & Computer Eng 1933 Electrical & Computer Engr 1200 University of Illinois at Urbana-Champaign Thesis M.S. PHD:Electr & Computer Eng-UIUC 10KS1200PHD