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oai:www.ideals.illinois.edu:2142/31095 2023-07-10 col_2142_5131 col_2142_8888 com_2142_5130 com_2142_8887 com_2142_234

Schutt-Ainé, José E. Chang, Chia-Lun 2012-05-22T00:27:32Z 2012-05-22T00:27:32Z 2012-05 2012-05-22T00:27:32Z 2012-05 S-parameter measurements of microstrips and striplines were done. The physical properties of the devices under test, consisting of nine single coplanar traces and nine pairs of coupled coplanar traces, are provided. The lab setup and equipment used to make such measurements are explained along with labeled pictures for visualization. Next, with the measured data, the limitations of the discrete Hilbert transform were tested. The results show the kind of properties frequency response data should have in order for the discrete Hilbert transform to correctly determine whether the data is causal or not. Item withdrawn by Mark Zulauf (zulauf@illinois.edu) on 2012-04-20T17:45:54Z Item was in collections: University of Illinois Theses & Dissertations (ID: 1) No. of bitstreams: 1 Chang_Chia-Lun.pdf: 14062211 bytes, checksum: 45a9cda14c8a9bf3709c27f165895dd6 (MD5) Made available in DSpace on 2012-05-22T00:27:32Z (GMT). No. of bitstreams: 2 Chang_Chia-Lun.pdf: 14062211 bytes, checksum: 45a9cda14c8a9bf3709c27f165895dd6 (MD5) license.txt: 4059 bytes, checksum: d5334387342c07a3bcfff01f43b05d86 (MD5) http://hdl.handle.net/2142/31095 en Copyright 2012 Chia-Lun Chang discrete Hilbert transform Causality S parameters S-parameter measurements Microstrip Stripline Probe station Network Analyzer Observing limitations of the discrete Hilbert transform with S-parameter measurements of microstrips and striplines text Electrical & Computer Eng 1933 Electrical & Computer Engr 1200 University of Illinois at Urbana-Champaign Thesis M.S. MS:Electr & Computer Eng-UIUC 10KS1200MS