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oai:www.ideals.illinois.edu:2142/46671 2023-07-11 col_2142_14787 col_2142_5131 com_2142_9630 com_2142_234 com_2142_5130

Advanced Photon Source (APS) user beamline scientist Salapaka, Srinivasa M. Preissner, Curt Mashrafi, Sheikh 2014-01-16T17:58:33Z 2014-01-16T17:58:33Z 2013-12 2014-01-16T17:58:33Z 2013-12 The goal of this thesis is to apply control algorithms to improve the performance of nanopositioning devices used on the beamline in Advanced Photon Source (APS) at Argonne National Laboratory (ANL). A prototype device, better known as the Early User Instrument (EUI) was the subject of this work. It consists of X-ray optics stage group that focuses the X-ray beam as a source-size-limited spot onto a sample held on the sample stage group. The controller algorithms that are used should provide the closed-loop with robust stability, large bandwidth, high resolution, disturbance rejection and noise attenuation. Conveniently, the field of scanning probe microscopes (SPMs) have already flourished on this aspect of controller algorithms proven to give desired closed-loop properties. Controller algorithms such as Proportional Integral Derivative (PID), Glover-McFarlane H-infinty algorithm, and 1DOF H-infinty controller were designed and implemented on the EUI system. The controller hardware used for implementation is National Instruments (NI) CompactRIO hardware that consists of a real-time controller, a FPGA built into the hardware chassis, analog I/O modules, and digital I/O modules. NI LabVIEW, the dedicated software to the NI hardware, was used to represent the discrete controllers as biquads structures that ran in the FPGA as a part of the closed-loop . The largest closed-loop bandwidth achieved is of 65 Hz through the 1DOF H-infinty controller and is a 171% improvement over the traditional PID controller. Highest closed- loop resolution achieved by the EUI with a 50 Hz bandwidth 1DOF H-infinty controller is 1.4 nanometers, which is a 180% improvement over the open loop resolution of 7 nanometers. imaging resolution and bandwidth imaging resolution Item withdrawn by Laura Spradlin (lspradl2@illinois.edu) on 2013-12-12T19:50:02Z Item was in collections: University of Illinois Theses & Dissertations (ID: 1) No. of bitstreams: 1 Mashrafi_Sheikh.pdf: 1440525 bytes, checksum: a077f15d2f60e38d6a818883f3ce5f6b (MD5) Made available in DSpace on 2014-01-16T17:58:33Z (GMT). No. of bitstreams: 2 Sheikh_Mashrafi.pdf: 1443980 bytes, checksum: ca448c64ad64307c77e978759821d255 (MD5) license.txt: 4065 bytes, checksum: 70be08383a1987ead0c9f07e9f02f4f5 (MD5) http://hdl.handle.net/2142/46671 en Copyright 2013 Sheikh Mashrafi control Control Architecture Advanced Photon Source (APS) Argonne National Laboratory (ANL) control algorithms nanopositioning nanopositioning devices Early User Instrument (EUI) X-ray optics robust stability bandwidth resolution disturbance rejection noise attenuation scanning probe microscope (SPM) closed-loop properties Proportional Integral Derivative (PID) Glover-McFarlane h-infinity algorithm 1DOF h-infinity controller h-infinity Glover-McFarlane controller Keith Glover Duncan McFarlane controller controller implementation National Instruments (NI) CompactRIO real-time controller Field-Programmable Gate Array (FPGA) LabVIEW biquads structures closed-loop bandwidth U.S. Department of Energy (DOE) Office of Science DE-AC02-06CH11357 DE-SC0004283 Cross Power Spectral Density (CPSD) Power Spectral Density (PSD) Degree Of Freedom (DOF) Discrete-Time Fourier Transform (DTFT) Hardware Description language (HDL) High-Level Synthesis (HLS) Hard X-ray Nanoprobe (HXN) In Situ Nanoprobe (ISN) Laser Doppler Displacement Meter (LDDM) Physik Instrumente (PI) Reconfigurable Input/Output (RIO) Advanced Photon Source (APS) beamline full-field imaging microscopy fluorescence mapping nanodiffraction transmission imaging reliability and repeatability of positioning systems modeling uncertainties insensitive modeling uncertainties quantifying trade-offs trade-offs design flexibility design methodology feedforward feedback performance objectives robustness nanoprobe model fitting curve fitting model reduction feedback controllers X-ray nanoprobe instrument third-generation synchrotron radiation source zone plate optics zone plate flexure stages piezoelectric actuators stacks flexure Piezoelectric high-stiffness stages high-resolution weak-link stages piezoelectric-transducer sub-nanometer resolution subnanometer optical heterodyning heterodyning Optodyne frequency-shifted laser beam PID controller digital to analog converter (DAC) analog input modules digital input modules analog output modules cRIO-9118 Virtex-5 Virtex-5 LX110 FPGA chassis NI-9223 NI-9402 NI-9263 System Identification Identification black-box identification parametric model non-parametric model welch pwelch tfestimate invfreqs time domain data band-limited uniform Gaussian white noise band-limited white noise resonant peak Balance Realization minimal realization controllability observability Experimental Frequency response transfer function Hankel singular values Hankel norm balanced truncation noise histogram Open Loop Resolution closed Loop Resolution Simulink simulation LabVIEW simulation discrete controller continuous controllers discrete Tustin tustins method discretization complementary sensitivity transfer function sensitivity transfer function robust stabilization coprime factorization Bezout identity Bezout stability margin algebraic Riccati equation Riccati equation sub-optimal suboptimal sub-optimal controller optimal controller mixed-sensitivity optimization sensitivity optimization generalized framework generalized controller framework stabilizing controller closed-loop objectives generalized plant nominal plant linear fractional transformation weighting transfer functions weighted sensitivity hinfsyn bode integral law waterbed effect second waterbed formula Skogestad Poslethwaite sensitivity weighting sensitivity weighting transfer function nanopositioner nanopositioning device nanopositioning system second order sections ASPE 28th Annual Meeting American Society for Precision Engineering (ASPE) Synchrotron Radiation Instrumentation Synchrotron Nanoprobe Instrument X-ray microscope performance enhancement through control architecture change text Mechanical Sci & Engineering 1917 Mechanical Engineering 0133 University of Illinois at Urbana-Champaign Thesis M.S. MS:Mechanical Engineerng -UIUC 10KS0133MS