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oai:www.ideals.illinois.edu:2142/49409 2023-07-11 col_2142_5131 col_2142_8888 com_2142_5130 com_2142_8887 com_2142_234

Schutt-Ainé, José E. Newell, Drew 2014-05-30T16:42:31Z 2014-05-30T16:42:31Z 2014-05 2014-05-30T16:42:31Z 2014-05 As frequencies have increased in circuits used for communication electronics, signal integrity concepts have become some of the foremost challenges that circuit designers must deal with. Specifically, high-speed links have been the focus of much of the research into mitigating signal integrity issues. To combat the effects of jitter and other signal integrity problems, circuit designers have begun using increasingly more complex circuitry peripheral to the high-speed link. This presents a challenge for system level designers because of their reliance on models accurately characterizing the underlying transistor level design. Existing standards, such as IBIS-AMI, are currently used at the system level to create designs. Alternatively, X-parameters may present a more intuitive and accurate method to generate models that are detailed and that preserve intellectual property. Item withdrawn by Laura Spradlin (lspradl2@illinois.edu) on 2014-04-16T13:40:35Z Item was in collections: University of Illinois Theses & Dissertations (ID: 1) No. of bitstreams: 1 Newell_Drew.pdf: 7893474 bytes, checksum: e18d2b0d8433314dfedec98fa2c44091 (MD5) Made available in DSpace on 2014-05-30T16:42:31Z (GMT). No. of bitstreams: 2 Drew_Newell.pdf: 7893464 bytes, checksum: e29ec3b8734628d5bb21dfe8aeb731e4 (MD5) license.txt: 4061 bytes, checksum: fc9a59430edcae20816e79ac4a298e07 (MD5) http://hdl.handle.net/2142/49409 en Copyright 2014 Drew J. Newell signal integrity x-parameter ibis Transistor level X-parameter simulations of equalization circuits text Electrical & Computer Eng 1933 Electrical & Computer Engr 1200 University of Illinois at Urbana-Champaign Thesis M.S. MS:Electr & Computer Eng-UIUC 10KS1200MS