2026-09-20T07:55:58Z https://www.ideals.illinois.edu/oai-pmh

oai:www.ideals.illinois.edu:2142/79712 2023-07-11 col_2142_5131 col_2142_8800 com_2142_5130 com_2142_5132

10000-01-01 2002 2015-09-25T19:53:07Z 2015-09-25T19:53:07Z Elizabeth M. Rudnick Yu, Xiaoming 2002 Finally, a GA-based diagnostic test generation approach is proposed for sequential circuits. A simple GA, which interacts with an efficient diagnostic fault simulator, is proposed to target groups of undistinguished fault pairs iteratively. Efficient data structures are used and heuristics are proposed to seed the initial populations of the GA. Experimental results also demonstrate the efficiency of the proposed method. Made available in DSpace on 2015-09-25T19:53:07Z (GMT). No. of bitstreams: 2 license.txt: 4848 bytes, checksum: 96035ab3f5e1c23cc7138a224ce498bd (MD5) 3070489.pdf: 4154593 bytes, checksum: aa30855ec43694e674e9d33f6f7c33f2 (MD5) Previous issue date: 2002 Embargo set by: Seth Robbins for item 80994 Lift date: Forever Reason: Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs U of I Only 107 p. Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2002. http://hdl.handle.net/2142/79712 (MiAaPQ)AAI3070489 eng Computer Science Automatic Test Generation Techniques for Sequential Circuits text Education Education University of Illinois at Urbana-Champaign Dissertation Ph.D.