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Cooper, S. Lance Dua, Praveen 2015-09-25T20:03:26Z 2015-09-25T20:03:26Z 10000-01-01 1997 1997 A characterization technique is developed to estimate the extent and shape of the spontaneously created composition modulation. The technique, based on resonant Raman spectroscopy, is general and can be utilized to map out composition regions in any semiconductor microstructure. Computer simulations were performed to confirm the validity of this technique. Made available in DSpace on 2015-09-25T20:03:26Z (GMT). No. of bitstreams: 2 license.txt: 4848 bytes, checksum: 96035ab3f5e1c23cc7138a224ce498bd (MD5) 9812576.pdf: 7137298 bytes, checksum: 3594f67bbd46664c0f55bb21dc833859 (MD5) Previous issue date: 1997 Embargo set by: Seth Robbins for item 81929 Lift date: Forever Reason: Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs U of I Only 153 p. Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1997. http://hdl.handle.net/2142/80647 (MiAaPQ)AAI9812576 eng Engineering, Electronics and Electrical Optical Studies of Iii-V Quantum Wires Grown by Strain-Induced Lateral Ordering (Silo) Process text Physics Physics University of Illinois at Urbana-Champaign Dissertation Ph.D.