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        <identifier>oai:www.ideals.illinois.edu:2142/80704</identifier>
        <datestamp>2023-07-11</datestamp>
        <setSpec>col_2142_5131</setSpec>
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        <thesis xmlns="http://www.ndltd.org/standards/metadata/etdms/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:dc="http://purl.org/dc/elements/1.1/" xsi:schemaLocation="http://www.ndltd.org/standards/metadata/etdms/1.1/ http://www.ndltd.org/standards/metadata/etdms/1.1/etdms11.xsd http://purl.org/dc/elements/1.1/ http://www.ndltd.org/standards/metadata/etdms/1.1/etdmsdc.xsd">
          <dc:contributor>Song, Bang-Sup</dc:contributor>
          <dc:creator>Chen, Hsin-Shu</dc:creator>
          <dc:date>2015-09-25T20:07:43Z</dc:date>
          <dc:date>2015-09-25T20:07:43Z</dc:date>
          <dc:date>10000-01-01</dc:date>
          <dc:date>2001</dc:date>
          <dc:date>2001</dc:date>
          <dc:description>This thesis presents a pipelined analog-to-digital converter (ADC) employing a capacitor error-averaging technique with look-ahead decision and digital error correction concepts that has been implemented in a CMOS technology to achieve high linearity and high speed. The capacitor error-averaging technique can perform an accurate multiply-by-two (x2) function required in high-resolution pipelined ADCs, while a high gain op-amp has been designed to minimize error due to finite DC gain. Three clock phases are required by the capacitor error-averaging technique (rather than the conventional two clock phases), and the look-ahead decision technique takes advantage of this by allowing the residue amplifiers a full clock phase of settling time (rather than a partial clock phase in a conventional pipelined ADC). The fully differential pipelined ADC achieves a throughput rate of 20 Msamples/s and a linearity of 14 b without any type of trimming or calibration. The prototype ADC, fabricated in a double-poly triple-metal 0.5-mum CMOS process, exhibits a differential nonlinearity (DNL) of +0.23/-0.28 least significant bit (LSB), an integral nonlinearity (INL) of +0.95/-1.06 LSB, a spurious-free dynamic range (SFDR) of 91.6 dB, and a signal-to-noise ratio (SNR) of 74.2 dB with a 1-MHz input and a 20-MHz clock. The chip occupies an active area of 10.8 mm 2 including digital logic, output buffers, and bond pads, and consumes 720 mW at 5 V.</dc:description>
          <dc:description>Made available in DSpace on 2015-09-25T20:07:43Z (GMT). No. of bitstreams: 2
license.txt: 4848 bytes, checksum: 96035ab3f5e1c23cc7138a224ce498bd (MD5)
3017039.pdf: 4235287 bytes, checksum: d884bb50149923182951bd32abf0aa1e (MD5)
  Previous issue date: 2001</dc:description>
          <dc:description>Embargo set by: Seth Robbins for item 81986
Lift date: Forever
Reason: Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs</dc:description>
          <dc:description>Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs</dc:description>
          <dc:description>U of I Only</dc:description>
          <dc:description>118 p.</dc:description>
          <dc:description>Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2001.</dc:description>
          <dc:identifier>http://hdl.handle.net/2142/80704</dc:identifier>
          <dc:identifier>(MiAaPQ)AAI3017039</dc:identifier>
          <dc:language>eng</dc:language>
          <dc:subject>Engineering, Electronics and Electrical</dc:subject>
          <dc:title>High-Resolution Nyquist -Rate Analog -to -Digital Converter</dc:title>
          <dc:type>text</dc:type>
          <degree>
            <department>Electrical Engineering</department>
            <discipline>Electrical Engineering</discipline>
            <grantor>University of Illinois at Urbana-Champaign</grantor>
            <level>Dissertation</level>
            <name>Ph.D.</name>
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