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        <identifier>oai:www.ideals.illinois.edu:2142/80808</identifier>
        <datestamp>2023-07-11</datestamp>
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        <thesis xmlns="http://www.ndltd.org/standards/metadata/etdms/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:dc="http://purl.org/dc/elements/1.1/" xsi:schemaLocation="http://www.ndltd.org/standards/metadata/etdms/1.1/ http://www.ndltd.org/standards/metadata/etdms/1.1/etdms11.xsd http://purl.org/dc/elements/1.1/ http://www.ndltd.org/standards/metadata/etdms/1.1/etdmsdc.xsd">
          <dc:contributor>Chuang, Shun-Lien</dc:contributor>
          <dc:contributor>Choquette, Kent D.</dc:contributor>
          <dc:creator>Young, Erik William</dc:creator>
          <dc:date>2015-09-25T20:08:16Z</dc:date>
          <dc:date>2015-09-25T20:08:16Z</dc:date>
          <dc:date>10000-01-01</dc:date>
          <dc:date>2002</dc:date>
          <dc:date>2002</dc:date>
          <dc:description>The high frequency modulation response for hybrid VCSELs is measured and compared to the theoretical response of the VCSEL derived through small signal analysis, with good agreement. For the two single mode structure wafers measured, the VCSELs with the implant aperture located farther away from the active region had the better response. The capacitance of the high speed structure VCSEL, where a deep (through the active region) and wide implant is used to reduce charge buildup underneath the oxide layers, and hence capacitance, is smaller than the capacitances of the other wafers due to reduction in the oxide capacitance. However, the capacitance of all the VCSEL wafers was increased because of the area of the bottom contact mesa and the photoresist bridge. (Abstract shortened by UMI.).</dc:description>
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license.txt: 4848 bytes, checksum: 96035ab3f5e1c23cc7138a224ce498bd (MD5)
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  Previous issue date: 2002</dc:description>
          <dc:description>Embargo set by: Seth Robbins for item 82090
Lift date: Forever
Reason: Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs</dc:description>
          <dc:description>Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs</dc:description>
          <dc:description>U of I Only</dc:description>
          <dc:description>101 p.</dc:description>
          <dc:description>Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2002.</dc:description>
          <dc:identifier>http://hdl.handle.net/2142/80808</dc:identifier>
          <dc:identifier>(MiAaPQ)AAI3070487</dc:identifier>
          <dc:language>eng</dc:language>
          <dc:subject>Physics, Optics</dc:subject>
          <dc:title>A Comprehensive Study of Hybrid Vertical -Cavity Surface -Emitting Lasers</dc:title>
          <dc:type>text</dc:type>
          <degree>
            <department>Electrical Engineering</department>
            <discipline>Electrical Engineering</discipline>
            <grantor>University of Illinois at Urbana-Champaign</grantor>
            <level>Dissertation</level>
            <name>Ph.D.</name>
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