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oai:www.ideals.illinois.edu:2142/81201 2023-07-11 col_2142_5131 col_2142_8888 com_2142_5130 com_2142_8887 com_2142_234

Fuchs, W. Kent Boppana, Vamsi 2015-09-25T20:10:02Z 2015-09-25T20:10:02Z 10000-01-01 1997 1997 Identifying and understanding the capabilities of sequential untestability identification by practical ATPG algorithms is vital to areas such as ATPG-based optimization and ATPG-based verification. This research provides conditions based on the state properties of the good and the faulty machines involved to ensure that the behavior of the circuit in the presence of untestable faults, as identified by practical sequential ATPG algorithms, is not different from the good circuit. This helps alleviate problems faced with the use of such algorithms in applications where inaccuracies in the identified untestabilities are unacceptable. Made available in DSpace on 2015-09-25T20:10:02Z (GMT). No. of bitstreams: 2 license.txt: 4848 bytes, checksum: 96035ab3f5e1c23cc7138a224ce498bd (MD5) 9812536.pdf: 3007213 bytes, checksum: 078395d992706fc45b2947a1c0de3062 (MD5) Previous issue date: 1997 Embargo set by: Seth Robbins for item 82482 Lift date: Forever Reason: Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs U of I Only 104 p. Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1997. http://hdl.handle.net/2142/81201 (MiAaPQ)AAI9812536 eng Computer Science State Information-Based Solutions for Sequential Circuit Diagnosis and Testing text Electrical Engineering Electrical Engineering University of Illinois at Urbana-Champaign Dissertation Ph.D.