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        <identifier>oai:www.ideals.illinois.edu:2142/81213</identifier>
        <datestamp>2023-07-11</datestamp>
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        <thesis xmlns="http://www.ndltd.org/standards/metadata/etdms/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:dc="http://purl.org/dc/elements/1.1/" xsi:schemaLocation="http://www.ndltd.org/standards/metadata/etdms/1.1/ http://www.ndltd.org/standards/metadata/etdms/1.1/etdms11.xsd http://purl.org/dc/elements/1.1/ http://www.ndltd.org/standards/metadata/etdms/1.1/etdmsdc.xsd">
          <dc:contributor>Song, Bang-Sup</dc:contributor>
          <dc:creator>Kwak, Sung Ung</dc:creator>
          <dc:date>2015-09-25T20:10:05Z</dc:date>
          <dc:date>2015-09-25T20:10:05Z</dc:date>
          <dc:date>10000-01-01</dc:date>
          <dc:date>1997</dc:date>
          <dc:date>1997</dc:date>
          <dc:description>This thesis presents a 5-5-5-6b pipelined ADC architecture that alleviates the requirements for initial capacitor matching and residue amplifier settling accuracy. The two 5-bit MSB stages are digitally calibrated to implement a 15-bit, 5 Msample/s low-spurious ADC using 1.4 $\mu$m CMOS. A skip-and-fill algorithm with non-linear interpolation also opens up the possibility of calibrating ADCs in the background synchronously with their normal operations. Interpolation results for the background calibration are compared with the foreground calibration results. The prototype ADC exhibits a DNL of +0.75/$-$0.6 LSB, an INL of +1.77/$-$1.58 LSB, and all spurious components are suppressed to below $-$93 dB when sampled at 5 MHz. The chip occupies an active area of 27 mm$\sp2,$ and the analog part consumes 60 mW at 5 V. Memory and arithmetic units for calibration are supplied externally in testing.</dc:description>
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license.txt: 4848 bytes, checksum: 96035ab3f5e1c23cc7138a224ce498bd (MD5)
9812665.pdf: 4929976 bytes, checksum: 9bbee6af91dd3557670a2248b27f0763 (MD5)
  Previous issue date: 1997</dc:description>
          <dc:description>Embargo set by: Seth Robbins for item 82494
Lift date: Forever
Reason: Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs</dc:description>
          <dc:description>Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs</dc:description>
          <dc:description>U of I Only</dc:description>
          <dc:description>139 p.</dc:description>
          <dc:description>Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1997.</dc:description>
          <dc:identifier>http://hdl.handle.net/2142/81213</dc:identifier>
          <dc:identifier>(MiAaPQ)AAI9812665</dc:identifier>
          <dc:language>eng</dc:language>
          <dc:subject>Engineering, Electronics and Electrical</dc:subject>
          <dc:title>Low-Spurious Analog-to-Digital Conversion Using Multi-Stage Code-Error Calibration</dc:title>
          <dc:type>text</dc:type>
          <degree>
            <department>Electrical Engineering</department>
            <discipline>Electrical Engineering</discipline>
            <grantor>University of Illinois at Urbana-Champaign</grantor>
            <level>Dissertation</level>
            <name>Ph.D.</name>
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