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        <identifier>oai:www.ideals.illinois.edu:2142/81219</identifier>
        <datestamp>2023-07-11</datestamp>
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          <dc:contributor>Fuchs, W. Kent</dc:contributor>
          <dc:creator>Venkataraman, Srikanth</dc:creator>
          <dc:date>2015-09-25T20:10:06Z</dc:date>
          <dc:date>2015-09-25T20:10:06Z</dc:date>
          <dc:date>10000-01-01</dc:date>
          <dc:date>1997</dc:date>
          <dc:date>1997</dc:date>
          <dc:description>Finally, an integrated technique that uses a combination of static and dynamic processing for the diagnosis of bridging faults in sequential circuits is presented. During diagnosis, the failing outputs from the test are used to adaptively determine the behavior of the bridge at each time-frame. Selective faulty state information is stored by performing accurate bridging fault simulation once before diagnosis. During diagnosis, the state information is used to increase the accuracy of diagnosis. The combination of adaptive simulation, state storage, and path-tracing has low computational requirements.</dc:description>
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  Previous issue date: 1997</dc:description>
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Lift date: Forever
Reason: Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs</dc:description>
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          <dc:identifier>(MiAaPQ)AAI9812798</dc:identifier>
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          <dc:subject>Computer Science</dc:subject>
          <dc:title>Simulation- and Deduction-Based Techniques for Fault Diagnosis</dc:title>
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            <department>Electrical Engineering</department>
            <discipline>Electrical Engineering</discipline>
            <grantor>University of Illinois at Urbana-Champaign</grantor>
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            <name>Ph.D.</name>
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