2026-09-22T00:57:03Z https://www.ideals.illinois.edu/oai-pmh

oai:www.ideals.illinois.edu:2142/81273 2023-07-11 col_2142_5131 col_2142_8888 com_2142_5130 com_2142_8887 com_2142_234

Stephen G. Bishop Ramachandran, Siddharth 2015-09-25T20:10:20Z 2015-09-25T20:10:20Z 10000-01-01 1998 1998 Reliability and stability issues have, for the first time, been studied in this materials system. Preferred regimes of operation are defined, and accelerated aging studies are used to predict device lifetimes. Made available in DSpace on 2015-09-25T20:10:20Z (GMT). No. of bitstreams: 2 license.txt: 4848 bytes, checksum: 96035ab3f5e1c23cc7138a224ce498bd (MD5) 9912350.pdf: 6006867 bytes, checksum: cb3480e0b921aa4ddf16dc0caf291573 (MD5) Previous issue date: 1998 Embargo set by: Seth Robbins for item 82554 Lift date: Forever Reason: Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs U of I Only 126 p. Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1998. http://hdl.handle.net/2142/81273 (MiAaPQ)AAI9912350 eng Physics, Optics Photoinduced Optical Integrated Circuits and Bulk Photonic Devices in Chalcogenide Glasses text Electrical Engineering Electrical Engineering University of Illinois at Urbana-Champaign Dissertation Ph.D.