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          <dc:contributor>Averback, Robert S.</dc:contributor>
          <dc:creator>Zhong, Yuncheng</dc:creator>
          <dc:date>2015-09-25T20:52:40Z</dc:date>
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          <dc:date>2002</dc:date>
          <dc:date>2002</dc:date>
          <dc:description>Ion induced surface smoothing and roughening processes were studied using Molecular Dynamics (MD) computer simulation. The simulations on self-ion bombarded W showed the effect of the surface on defect production and the roughening of the surface. The simulations on the CuTi, Ag and Ni with amorphous and crystalline states reveal the smoothing and roughening process due to a single ion impact.</dc:description>
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  Previous issue date: 2002</dc:description>
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Lift date: Forever
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          <dc:title>Ion Implantation Damage in Solids</dc:title>
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